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链到 35717 个记录:
| 记录 | 名称, 品牌, 型号 | 实时确认 | ||
|---|---|---|---|---|
| 401 | Threaded spring force contact with probe tip F, D 4.0 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-F-1,5 N-Rh-4,0 测试探针 | 11 H 4486 | 11 H 4486 | 实时确认>> |
| 402 | H708, receptacle for probe F708, solder connection 测试探头附件 | 12 H 1580 | 12 H 1580 | 实时确认>> |
| 403 | Twist-proof spring force contact with probe tip Y11, A 2.15, B 0.65 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 1053/G-Y11-1,5 N-Au-2,15x0,65C 测试探针 | 11 H 4526 | 11 H 4526 | 实时确认>> |
| 404 | Standard spring-loaded contact with tip A, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015-A-1,5 N-Au-1,8 测试探针 | 12 H 2040 | 12 H 2040 | 实时确认>> |
| 405 | F886.17SM, switching probe, plunger tip 17, TD 3.0 mm, CuBe, gold 测试探针 | 12 H 5064 | 12 H 5064 | 实时确认>> |
| 406 | F772.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold 测试探针 | 12 H 1512 | 12 H 1512 | 实时确认>> |
| 407 | ICT spring force contact with probe tip H, D 1.15 mm, steel, 1.91 mm grid, 1.6 N, 1013/Z-H-1,6 N-Au-1,15 测试探针 | 12 H 2212 | 12 H 2212 | 实时确认>> |
| 408 | F768.06, probe with plunger tip 06, TD 0.9 mm, CuBe, gold 测试探针 | 11 H 5582 | 11 H 5582 | 实时确认>> |
| 409 | F733.11, probe with plunger tip 11, TD 1.8 mm, CuBe, gold 测试探针 | 12 H 1646 | 12 H 1646 | 实时确认>> |
| 410 | F100.43S090L200, probe with plunger tip 43, TD 0.9 mm, steel, long-life gold 测试探针 | 11 H 4618 | 11 H 4618 | 实时确认>> |
| 411 | F732.07, probe with plunger tip 07, TD 1.75 mm, steel, long-life gold 测试探针 | 11 H 4727 | 11 H 4727 | 实时确认>> |
| 412 | Battery charging and interface contact with probe tip B1D, D 4.0 mm, steel, 6.5 mm grid, 3.0 N, 5082-B1D-3,0 N-Au-4,0 测试探针 | 12 H 2390 | 12 H 2390 | 实时确认>> |
| 413 | T0052641099, temperature probe 其他配件和备件 | 09 L 5647 | 09 L 5647 | 实时确认>> |
| 414 | F588.05, probe with plunger tip 05, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5730 | 11 H 5730 | 实时确认>> |
| 415 | Charging and battery contact, 2.7 mm, TK0054B.05.1.30.C.50.A, 50 cN, 1.5 A 测试探针 | 12 H 1383 | 12 H 1383 | 实时确认>> |
| 416 | KSL 092 Z, contact pin, 9.2 mm 测试探针 | 12 H 580 | 12 H 580 | 实时确认>> |
| 417 | ICT spring force contact with probe tip H, 1.5 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-H-1,5 N-Au-1,5 测试探针 | 12 H 2162 | 12 H 2162 | 实时确认>> |
| 418 | Standard spring-loaded contact with tip D, D 1.0 mm, steel, 1.91 mm grid, 0.8 N, 1010-D-0,8 N-Au-1,0 测试探针 | 12 H 2024 | 12 H 2024 | 实时确认>> |
| 419 | F731.06, probe with plunger tip 06, TD 1.3 mm, CuBe, gold 测试探针 | 11 H 4705 | 11 H 4705 | 实时确认>> |
| 420 | Threaded spring force contact with probe tip D, D 1.0 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-D-1,5 N-Rh-1,0 测试探针 | 11 H 4475 | 11 H 4475 | 实时确认>> |
| 421 | F883.17, switching probe, plunger tip 17, TD 2.3 mm, plastic, uncoated 测试探针 | 12 H 1721 | 12 H 1721 | 实时确认>> |
| 422 | F875.16, switching probe, plunger tip 16, TD 0.64 mm, CuBe, gold 测试探针 | 12 H 1680 | 12 H 1680 | 实时确认>> |
| 423 | F111.03, probe with plunger tip 03, TD 0.53 mm, steel, nickel 测试探针 | 11 H 5552 | 11 H 5552 | 实时确认>> |
| 424 | F886.17SM, switching probe, plunger tip 17, TD 4.0 mm, CuBe, gold 测试探针 | 12 H 1736 | 12 H 1736 | 实时确认>> |
| 425 | F886.17SM, switching probe, plunger tip 17, TD 5.9 mm, uncoated plastic 测试探针 | 12 H 5063 | 12 H 5063 | 实时确认>> |
| 426 | Probe F340.07, with plunger tip 07, TD 3.5 mm, steel, long-life gold 测试探针 | 11 H 5973 | 11 H 5973 | 实时确认>> |
| 427 | Charging and battery contact 1.4 mm, TK0072B, gold-plated CuBe steel tip, 3.0 A 测试探针 | 12 H 1371 | 12 H 1371 | 实时确认>> |
| 428 | Switching probe, plunger tip 06, F885.06L, 350 cN, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 4814 | 11 H 4814 | 实时确认>> |
| 429 | Threaded spring force contact with probe tip C, D 2.3 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-C-1,5 N-Au-2,3 测试探针 | 11 H 4470 | 11 H 4470 | 实时确认>> |
| 430 | ICT spring force contact with probe tip Q5, D 1.06 mm, steel, 2.54 mm grid, 2.25 N, 1025/E-Q5-2,25 N-Au-1,06 测试探针 | 12 H 2144 | 12 H 2144 | 实时确认>> |
| 431 | Probe with plunger tip 16, F680.16 测试探针 | 11 H 4606 | 11 H 4606 | 实时确认>> |
| 432 | Switched spring contact with probe tip C, D 2.0 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 3014/2G-C-1,5 N-Au-2,0C 测试探针 | 12 H 2504 | 12 H 2504 | 实时确认>> |
| 433 | F111.18, probe with plunger tip 18, TD 0.53 mm, steel, long-life gold 测试探针 | 11 H 5567 | 11 H 5567 | 实时确认>> |
| 434 | Switched spring contact with probe tip C, D 3.0 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 3014/2G-C-1,5 N-Au-3,0C 测试探针 | 12 H 2506 | 12 H 2506 | 实时确认>> |
| 435 | High-current spring force probe with tip FX, D 1.0 mm, gold-plated CuBe, 2.54 mm grid, 3.0 N, 1021/G-FX-3,0 N-Au-1,0 测试探针 | 12 H 2244 | 12 H 2244 | 实时确认>> |
| 436 | F772.21, probe with plunger tip 21, TD 1.3 mm, steel, long-life gold 测试探针 | 11 H 4637 | 11 H 4637 | 实时确认>> |
| 437 | Spring contact with tip D, 2.4 mm, steel, 4.0 mm grid, 1.5 N, 1040-D-1,5 N-Au-2,4 测试探针 | 12 H 2093 | 12 H 2093 | 实时确认>> |
| 438 | Surface probe, for Testo 175 T2 and Testo 720, 0613 1912 温度计和湿度计 | 21 K 782 | 21 K 782 | 实时确认>> |
| 439 | Standard spring-loaded contact with tip D, D 0.65 mm, CuBe, 2.54 mm grid, 1.5 N, 1015-D-1,5 N-Au-0,65 测试探针 | 12 H 2049 | 12 H 2049 | 实时确认>> |
| 440 | F731.11, probe with plunger tip 11, TD 0.75 mm, CuBe, gold 测试探针 | 11 H 4713 | 11 H 4713 | 实时确认>> |
| 441 | ICT rotary spring contact with tip KD, D 1.2 mm, steel, 1.91 mm grid, 2.0 N, 1012/D-KD-2,0 N-Au-1.2 测试探针 | 12 H 2439 | 12 H 2439 | 实时确认>> |
| 442 | Probe 0.65 mm, TK0004MC.B.0.21.S.40.R, tip B, 1.0 A, 1.5 mm, 1.2 mm, rhodium-plated 测试探针 | 12 H 1313 | 12 H 1313 | 实时确认>> |
| 443 | Probe 0.65 mm, TK0004MC.U.0.21.S.40.A, tip U, 1.0 A, 1.5 mm, 1.2 mm 测试探针 | 12 H 1317 | 12 H 1317 | 实时确认>> |
| 444 | ICT spring force contact with probe tip V1, D 0.9 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-V1-1,5 N-Au-0,9 测试探针 | 12 H 2176 | 12 H 2176 | 实时确认>> |
| 445 | Probe 0.9 mm, TK0006MC.B.0.34.S.55.A, 0.34 mm, tip B, 1.0 A, 2.0 mm, 1.6 mm 测试探针 | 12 H 1332 | 12 H 1332 | 实时确认>> |
| 446 | Threaded spring force contact with probe tip E, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-E-1,5 N-Au-1,8 测试探针 | 11 H 4413 | 11 H 4413 | 实时确认>> |
| 447 | F209.01, probe with tip 01, TD 0.35 mm, CuBe, gold 测试探针 | 11 H 5520 | 11 H 5520 | 实时确认>> |
| 448 | F733.06C, probe with plunger tip 06, TD 3.0 mm, CuBe, gold 测试探针 | 12 H 1671 | 12 H 1671 | 实时确认>> |
| 449 | Charging and battery contact 1.91 mm, TK0073B, tip J, 3.0 A, 1.14 mm, 1.0 mm 测试探针 | 12 H 1374 | 12 H 1374 | 实时确认>> |
| 450 | FWZ732T, probe insertion tool, for screwing, with torque limiting 测试探头附件 | 12 H 1632 | 12 H 1632 | 实时确认>> |
| 451 | Test contact, TF15, 1.5, 3.5, 1.2 to 1.5 mm 测试探针 | 12 H 1406 | 12 H 1406 | 实时确认>> |
| 452 | Test probes, 4.0 mm, adjustable, XSAP-4, red 测试探针 | 35 F 1701 | 35 F 1701 | 实时确认>> |
| 453 | RF spring force contact for SMC-m, 5.3 N, 5.0, 1.5 mm, screwable, PTR 7860/G-Z9A-5.3N-AU-5.0/1.5C 测试探针 | 12 H 2577 | 12 H 2577 | 实时确认>> |
| 454 | F733.12, probe with plunger tip 12, TD 3.0 mm, CuBe, gold 测试探针 | 12 H 1648 | 12 H 1648 | 实时确认>> |
| 455 | Probe 0.9 mm, TK0006MC.E.0.60.S.55.A, 0.60 mm, tip E, 1.0 A, 2.0 mm, 1.6 mm 测试探针 | 12 H 1338 | 12 H 1338 | 实时确认>> |
| 456 | Spring contact with tip E, D 4.0 mm, steel, 4.0 mm grid, 1.5 N, 1040-E-1,5 N-Au-4,0 测试探针 | 12 H 2094 | 12 H 2094 | 实时确认>> |
| 457 | F773.21, probe with plunger tip 21, TD 1.8 mm, steel, long-life gold 测试探针 | 11 H 5780 | 11 H 5780 | 实时确认>> |
| 458 | F732.16, probe with plunger tip 16, TD 1.0 mm, CuBe, gold 测试探针 | 12 H 1624 | 12 H 1624 | 实时确认>> |
| 459 | F563.06, probe with plunger tip 06, TD 4.0 mm, CuBe, gold 测试探针 | 12 H 1563 | 12 H 1563 | 实时确认>> |
| 460 | RF spring force contact for SMC-m, 5.3 N, 5.0, 1.5 mm, pluggable, PTR 7860-Z9A-5.3N-AU-5.0/1.5C 测试探针 | 12 H 2576 | 12 H 2576 | 实时确认>> |
| 461 | High-current spring force contact with probe tip CX, D 4.0 mm, gold-plated CuBe, 5.0 mm grid, 3.0 N, 1075/G-CX-3,0 N-Au-4,0C 测试探针 | 12 H 2274 | 12 H 2274 | 实时确认>> |
| 462 | Threaded spring force contact with probe tip F, D 2.3 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 5110/G-F-1,5 N-Au-2,3C 测试探针 | 12 H 2382 | 12 H 2382 | 实时确认>> |
| 463 | High-current spring force probe with tip FX, D 1.0 mm, gold-plated CuBe, 2.54 mm grid, 3.0 N, 1021-FX-3,0 N-Au-1,0C 测试探针 | 12 H 2234 | 12 H 2234 | 实时确认>> |
| 464 | ICT spring force contact with probe tip BSTL, D 0.5 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-BSTL-1,5 N-Au-0,5 测试探针 | 12 H 2154 | 12 H 2154 | 实时确认>> |
| 465 | Coax spring force contact with probe tip D, 1.0 x 1.5 mm, gold-plated steel/gold-plated CuBe, 6.5 mm grid, 1.5/5.0 N, 5207/G-D-6,5 N-Au-1,0x1,5 测试探针 | 12 H 2396 | 12 H 2396 | 实时确认>> |
| 466 | Standard spring-loaded contact with tip C, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015-C-1,5 N-Au-1,8 测试探针 | 12 H 2042 | 12 H 2042 | 实时确认>> |
| 467 | Probe with plunger tip 29, TD 1.3 mm, CuBe, gold, F706.29B130G200 测试探针 | 11 H 5873 | 11 H 5873 | 实时确认>> |
| 468 | Set Testo 830-T2, with probe and protective cover, 0563 8312 温度计和湿度计 | 21 K 8609 | 21 K 8609 | 实时确认>> |
| 469 | F708.11, probe with plunger tip 11, TD 0.85 mm, CuBe, gold, 100 cN 测试探针 | 12 H 1578 | 12 H 1578 | 实时确认>> |
| 470 | F605.01, probe with plunger tip 01, TD 0.5 mm, steel, long-life gold 测试探针 | 11 H 5812 | 11 H 5812 | 实时确认>> |
| 471 | High-current spring force contact with probe tip HX, D 1.8 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 1060/G-HX-3,0 N-Au-1,8C 测试探针 | 12 H 2334 | 12 H 2334 | 实时确认>> |
| 472 | F605.11, probe with plunger tip 11, TD 0.5 mm, steel, long-life gold 测试探针 | 11 H 5820 | 11 H 5820 | 实时确认>> |
| 473 | Threaded spring force contact with probe tip H, D 4.2 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-H-1,5 N-Rh-4,2 测试探针 | 11 H 4495 | 11 H 4495 | 实时确认>> |
| 474 | Test contact, TF63, 40 A, 6.3 mm 测试探针 | 12 H 1416 | 12 H 1416 | 实时确认>> |
| 475 | Threaded spring force contact with probe tip K, D 1.75 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-K-1,5 N-Rh-1,75 测试探针 | 11 H 4457 | 11 H 4457 | 实时确认>> |
| 476 | Standard spring-loaded contact with tip A, D 0.9 mm, steel, 1.27 mm grid, 0.7 N, 1007-A-0.7 N-Au-0,9 mm 测试探针 | 12 H 1801 | 12 H 1801 | 实时确认>> |
| 477 | ICT spring force contact with probe tip H, 0.9 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-H-1,5 N-Au-0,9 测试探针 | 12 H 2458 | 12 H 2458 | 实时确认>> |
| 478 | ICT spring force contact with probe tip H, 1.5 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-H-1,5 N-Au-1,5 测试探针 | 12 H 2460 | 12 H 2460 | 实时确认>> |
| 479 | Test probes, 4.0 mm, adjustable, XSAP-4, black 测试探针 | 35 F 1700 | 35 F 1700 | 实时确认>> |
| 480 | F111.21, probe with plunger tip 21, TD 0.53 mm, steel, nickel 测试探针 | 11 H 5568 | 11 H 5568 | 实时确认>> |
| 481 | Standard spring-loaded contact with tip C, D 0.9 mm, steel, 1.27 mm grid, 0.7 N, 1007-A-0.7 N-Au-0,9 mm 测试探针 | 12 H 1805 | 12 H 1805 | 实时确认>> |
| 482 | F785.06L, probe with plunger tip 06, TD 3.5 mm, CuBe, gold 测试探针 | 11 H 5806 | 11 H 5806 | 实时确认>> |
| 483 | F768.21, probe with plunger tip 21, TD 0.6 mm, steel, long-life gold 测试探针 | 11 H 5590 | 11 H 5590 | 实时确认>> |
| 484 | Threaded spring force contact with probe tip G, D 1.3 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-G-1,5 N-Rh-1,3 测试探针 | 11 H 4417 | 11 H 4417 | 实时确认>> |
| 485 | F703.33S078L150, probe with plunger tip 33, TD 0.78 mm, steel, long-life gold 测试探针 | 11 H 5658 | 11 H 5658 | 实时确认>> |
| 486 | H340, receptacle for probe F340 测试探头附件 | 11 H 5980 | 11 H 5980 | 实时确认>> |
| 487 | Switching probe, plunger tip 16, F885.16SM, 900 cN, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4828 | 11 H 4828 | 实时确认>> |
| 488 | ICT spring force contact with probe tip Q, D 1.5 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-Q-1,5 N-Au-1,5 测试探针 | 12 H 2172 | 12 H 2172 | 实时确认>> |
| 489 | ICT spring force contact with probe tip BST1, D 0.64 mm, steel, 1.91 mm grid, 1.5 N, 1012/E-BST1-1,5 N-Au-0,64 测试探针 | 12 H 2012 | 12 H 2012 | 实时确认>> |
| 490 | F886.17SM, switching probe, plunger tip 17, TD 3.0 mm, uncoated Host. 测试探针 | 12 H 1744 | 12 H 1744 | 实时确认>> |
| 491 | Threaded spring force contact with probe tip C, D 3.5 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 5110/G-C-1,5 N-Au-3,5C 测试探针 | 12 H 2376 | 12 H 2376 | 实时确认>> |
| 492 | F875.11, switching probe, plunger tip 11, TD 0.64 mm, CuBe, gold 测试探针 | 11 H 4765 | 11 H 4765 | 实时确认>> |
| 493 | Battery charging and interface contact with probe tip D, D 2.3 mm, CuBe, 4.0 mm grid, 1.5 N, 5110/S-D-1,5 N-Au-2,3C 测试探针 | 12 H 2354 | 12 H 2354 | 实时确认>> |
| 494 | ICT spring force contact with probe tip V, D 0.9 mm, steel, 2.54 mm grid, 2.25 N, 1025/E-V-2,25 N-Au-0,9 测试探针 | 12 H 2146 | 12 H 2146 | 实时确认>> |
| 495 | Threaded spring force contact with probe tip C1S, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-C1S-1,5 N-HTK-1,8 测试探针 | 11 H 4407 | 11 H 4407 | 实时确认>> |
| 496 | F100.15B250B300, probe with plunger tip 15, TD 2.5 mm, CuBe, gold 测试探针 | 11 H 4647 | 11 H 4647 | 实时确认>> |
| 497 | Immersion probe for Testo 176 T2, 0614 1272 温度计和湿度计 | 21 K 787 | 21 K 787 | 实时确认>> |
| 498 | F773.14, probe with plunger tip 14, TD 2.3 mm, steel, long-life gold 测试探针 | 11 H 5772 | 11 H 5772 | 实时确认>> |
| 499 | Switching probe, plunger tip 06, F885.06L, 900 cN, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4822 | 11 H 4822 | 实时确认>> |
| 500 | Test contact, TF07, 0.64, 2.2, 0.6 to 0.7 mm 测试探针 | 12 H 1400 | 12 H 1400 | 实时确认>> |
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