11 H 5520 测试探针

11 H 5520 测试探针-产品快照

品牌:
11 H 5520
型号:
11 H 5520

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产品介绍

11 H 5520 测试探针

F209.01, probe with tip 01, TD 0.35 mm, CuBe, gold

11 H 5520

Fine pitch probes with plunger tip for 0.7 mm grid, type Feinmetall F209. Spring-loaded at both ends, this probe is also used for testing components (IC, MCM, LCD, etc.). Connection to interface (translator board or the like) by means of spring-loaded interface plunger; Smallest mounting pitch: 0.7 mm. Maximum spring travel: 2.5 mm. Recommended spring travel: 2.0 mm. Prestress: 10 cN. Spring force at recommended spring travel: 50 cN ±20 %. Useful life: 1.0 million load cycles. Pointing precision: ±0.09 mm. Operating temperatures: –20 to +80 °C. Maximum continuous current: 1.0 A. Typical contact resistance: 70 mohm. Barrel: gold-plated bronze. Spring: silver-plated spring steel, tip design: 01 with 90° taper. Technical attributes (type, plunger with tip design, tip diameter (TD), material, finish): F209.01, probe with tip 01, TD 0.35 mm, CuBe, gold

There are 5 piece in stock

Test probes

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