12 H 2040 测试探针-产品快照
- 品牌:
- 12 H 2040
- 型号:
- 12 H 2040
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| 供应商名称 | 电话 | 备注 |
|---|---|---|
| 暂无展示，可咨询在线客服 | 400-811-6961 |
 微信咨询，as10@gchane.com , QQ3350168184
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产品介绍
12 H 2040 测试探针
Standard spring-loaded contact with tip A, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015-A-1,5 N-Au-1,8
12 H 2040
Standard spring contacts, type PTR 10. Design A: concave 90°, For connector pins, wire-wrap posts and straight / bent terminals. To be used on clean PCB because of the risk of contamination. Design B: pointed tip 30°, for PCB traces, through-plating, solder joints, and test pads. Design BS: practical flexible needle, reliable point-of use penetration of flux and coiling on unwashed PCBs, modules, or SMDs. Design C: serrated, A universal head for straight or curved hookup wires, wire-wrap posts and connector pins. Design D: round head, for contacting PCB traces and contact surfaces. The round tip does not leave marks on the contact surface. Also used to contact socket contacts in connectors. Design G: four-point crown, for hookup wires, solder joints and test pads without heavy contamination. Design H: pyramid, contact to vias without problems, also suitable for use on objects with flux residue. Form Q: four-point crown, self-cleaning, designed to test contaminated printed circuit boards. The special cut of the tip allows UCx005F UCx000D UC contaminates to fall out easily. Test probes with probe tip series 1015. Grid: 2.54 mm. Maximum travel: 4.4 mm. Working travel: 3.5 mm. Spring force at working stroke (±20 %): 1.5 N. Spring prestress: 0.4 N. Current load capacity: 3.0 A. Contact resistance: typ. 30 mohm. Barrel: gold-plated bronze. Spring: gold-plated spring steel. Technical attributes (type, tip shape, tip diameter, plunger material): 1015-A-1,5 N-Au-1,8, A, 1.8 mm, steel
There are 876 piece in stock 228 452 176 105 633 285 3 190
Test probes
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