Interconnect Devices, Inc. Test Connectors >> S-2-V-7-D 连接器测试连接器弹簧测试探针-产品快照
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- Interconnect Devices, Inc. Test Connectors >>
- 型号:
- S-2-V-7-D
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Interconnect Devices, Inc. Test Connectors >> S-2-V-7-D 连接器测试连接器弹簧测试探针
Interconnect Devices, Inc. S-2-V-7-D
Interconnect Devices, Inc. Test Connectors >>
SPRING CONTACT PROBE Overview Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs. Tip Style: Tulip Maximum Travel: 0.160 (4.06) In.(mm) Spring Force: 7.0 Oz. @ 0.100 (2.54) In.(mm)
Brand/Series : S Series Centerline, Spacing : 0.100 (2.54) In.(mm) In.(mm) Contact Resistance : 35 Milliohms (Max.) Milliohms (Max.) Force, Spring : 7.0 Oz. Oz. Gender : Probe Length, Overall : 0.970 In. In. Material, Barrel : Nickel/Silver Material, Plating : Duralloy Plated (Plunger) Material, Plunger : Beryllium Copper Material, Spring : Beryllium Copper Maximum Travel : 0.160 In. Minimum Centers : 0.100 In. Primary Type : Probe Size : Size 2 Tip Style : V - Crown 4pt Type : Connector Probe
Connectors Test Connectors Spring Test Probes
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