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Feinmetall | 德国 | 探针 | Feinmetall供应商 |
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链到 35717 个记录:
| 记录 | 名称, 品牌, 型号 | 实时确认 | ||
|---|---|---|---|---|
| 601 | F732.05, probe with plunger tip 05, TD 2.0 mm, CuBe, gold 测试探针 | 12 H 1600 | 12 H 1600 | 实时确认>> |
| 602 | F732.17, probe with plunger tip 17, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 4733 | 11 H 4733 | 实时确认>> |
| 603 | ICT spring force contact with probe tip V1, D 0.9 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-V1-1,5 N-Au-0,9 测试探针 | 12 H 2474 | 12 H 2474 | 实时确认>> |
| 604 | RF spring force contact for MM 8130, MM8430 and MS 156 connections, 5.3 N, 2.8, 0.5 mm, pluggable, PTR 7860-Z2D-5.3N-AU-2.8/0.5C 测试探针 | 12 H 2562 | 12 H 2562 | 实时确认>> |
| 605 | Spring contact with tip F, D 4.0 mm, steel, 4.0 mm grid, 1.5 N, 1040-F-1,5 N-Au-4,0 测试探针 | 12 H 2097 | 12 H 2097 | 实时确认>> |
| 606 | F100.38S090L200, probe with plunger tip 38, TD 0.9 mm, steel, long-life gold 测试探针 | 11 H 4617 | 11 H 4617 | 实时确认>> |
| 607 | F111.01, probe with plunger tip 01, TD 0.53 mm, steel, nickel 测试探针 | 11 H 5550 | 11 H 5550 | 实时确认>> |
| 608 | Battery charging and interface contact with probe tip D, D 1.3 mm, gold-plated CuBe, 3.0 mm grid, 2.0 N, 5099-D-2,0 N-Au-1,3C 测试探针 | 11 H 4951 | 11 H 4951 | 实时确认>> |
| 609 | ICT spring force contact with probe tip G, D 1.3 mm, steel, 2.54 mm grid, 2.25 N, 1025/E-G-2,25 N-Au-1,3 测试探针 | 12 H 2136 | 12 H 2136 | 实时确认>> |
| 610 | F786.06, probe with plunger tip 06, TD 4.5 mm, CuBe, gold 测试探针 | 11 H 4639 | 11 H 4639 | 实时确认>> |
| 611 | Probe, TK0003MC.B.0.16.S.15.A, tip B, 0.3 A, 1.5 mm, 1.2 mm 测试探针 | 12 H 1308 | 12 H 1308 | 实时确认>> |
| 612 | F886.17SM, switching probe, plunger tip 17, TD 4.5 mm, CuBe, gold 测试探针 | 12 H 1738 | 12 H 1738 | 实时确认>> |
| 613 | Switching probe, plunger tip 16, F885.16S, 900 cN, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4826 | 11 H 4826 | 实时确认>> |
| 614 | Charging and battery contact 5.08 mm, TK0061B, 3.0 A, 2.62 mm, 1.7 mm 测试探针 | 12 H 1356 | 12 H 1356 | 实时确认>> |
| 615 | F772.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 4631 | 11 H 4631 | 实时确认>> |
| 616 | F886.17LM, switching probe, plunger tip 17, 3.5 mm, uncoated Host. 测试探针 | 12 H 5056 | 12 H 5056 | 实时确认>> |
| 617 | F732.06, probe with plunger tip 06, TD 1.8 mm, CuBe, gold 测试探针 | 12 H 1604 | 12 H 1604 | 实时确认>> |
| 618 | Hot-wire probe for Testo 435-2, 435-4, 0635 1025 温度计和湿度计 | 21 K 809 | 21 K 809 | 实时确认>> |
| 619 | Safety test probe, red, PRUEF 1610 FT Au, 975018701 测试探针 | 35 F 128 | 35 F 128 | 实时确认>> |
| 620 | F708.11, probe with plunger tip 11, TD 0.85 mm, CuBe, gold, 80 cN 测试探针 | 12 H 1586 | 12 H 1586 | 实时确认>> |
| 621 | Test contact, TF10, 1.0, 2.3, 0.95 to 1.0 mm 测试探针 | 12 H 1404 | 12 H 1404 | 实时确认>> |
| 622 | F708.11, probe with plunger tip 11, TD 0.85 mm, CuBe, gold, 50 cN 测试探针 | 12 H 1584 | 12 H 1584 | 实时确认>> |
| 623 | Penetration probe NTC for testo Saveris 2 数据记录器附件 | 21 K 7686 | 21 K 7686 | 实时确认>> |
| 624 | Probe F330.05, with plunger tip 05, TD 2.1 mm, steel, nickel 测试探针 | 11 H 5952 | 11 H 5952 | 实时确认>> |
| 625 | ICT spring force contact with probe tip H, D 1.8 mm, steel, 2.54 mm grid, 2.25 N, 2021-H-2,25 N-Rh-1,8 测试探针 | 12 H 2116 | 12 H 2116 | 实时确认>> |
| 626 | Probe F330.05, with plunger tip 05, TD 2.1 mm, steel, long-life gold 测试探针 | 11 H 5953 | 11 H 5953 | 实时确认>> |
| 627 | F562.05, probe with plunger tip 05, TD 1.9 mm, steel, long-life gold 测试探针 | 11 H 4641 | 11 H 4641 | 实时确认>> |
| 628 | Charging and battery contact, 6.66 mm grid, 3.0 A, 4.15 mm, 2.75 mm, Tekon TK0064B.J2.60.M57.A 测试探针 | 12 H 1390 | 12 H 1390 | 实时确认>> |
| 629 | Pipe surface probe, RFN-500, 560 ohm, with nickel sensor 温度传感器和湿度传感器 | 06 N 8486 | 06 N 8486 | 实时确认>> |
| 630 | ICT spring force contact with probe tip H, D 0.5 mm, CuBe, 1.27 mm grid, 1.5 N, 1008/E-H-1,5 N-Au-0,5C 测试探针 | 12 H 2402 | 12 H 2402 | 实时确认>> |
| 631 | Battery charging and interface contact with probe tip C, D 2.3 mm, CuBe, 4.0 mm grid, 1.5 N, 5110/S-C-1,5 N-Au-2,3C 测试探针 | 12 H 2350 | 12 H 2350 | 实时确认>> |
| 632 | F886.17LM, switching probe, plunger tip 17, 3.5 mm, uncoated plastic 测试探针 | 12 H 5057 | 12 H 5057 | 实时确认>> |
| 633 | Standard spring-loaded contact with tip H, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015-H-1,5 N-Ni-1,8 测试探针 | 12 H 2052 | 12 H 2052 | 实时确认>> |
| 634 | F773.07, probe with plunger tip 07, TD 2.3 mm, steel, long-life gold 测试探针 | 11 H 5768 | 11 H 5768 | 实时确认>> |
| 635 | F563.06, probe with plunger tip 06, TD 2.5 mm, CuBe, gold 测试探针 | 12 H 1562 | 12 H 1562 | 实时确认>> |
| 636 | F786.06, probe with plunger tip 06, TD 2.0 mm, CuBe, gold 测试探针 | 12 H 1540 | 12 H 1540 | 实时确认>> |
| 637 | Switching probe, plunger tip 06, F885.06LM, 200 cN, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4804 | 11 H 4804 | 实时确认>> |
| 638 | Threaded spring force contact with probe tip F, D 2.0 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-F-1,5 N-Au-2,0 测试探针 | 11 H 4451 | 11 H 4451 | 实时确认>> |
| 639 | F564.06, probe with plunger tip 06, TD 4.0 mm, CuBe, Rh 测试探针 | 11 H 4650 | 11 H 4650 | 实时确认>> |
| 640 | Pick-up pin, TK0084FS, 6.1 mm, 8.5 mm, 11 mm, 13.5 mm 测试探针 | 12 H 1350 | 12 H 1350 | 实时确认>> |
| 641 | KSL 151 Z, contact pin, 15.1 mm 测试探针 | 12 H 586 | 12 H 586 | 实时确认>> |
| 642 | F731.11, probe with plunger tip 11, TD 0.65 mm, CuBe, gold 测试探针 | 11 H 4707 | 11 H 4707 | 实时确认>> |
| 643 | Battery charging and interface contact with probe tip D, D 4.0 mm, steel, 6.5 mm grid, 3.0 N, 5082-D-3,0 N-Au-4,0 测试探针 | 12 H 2392 | 12 H 2392 | 实时确认>> |
| 644 | F733.06, probe with plunger tip 06, TD 3.0 mm, CuBe, gold 测试探针 | 12 H 1665 | 12 H 1665 | 实时确认>> |
| 645 | ICT spring force contact with probe tip BST1, D 0.62 mm, steel, 2.54 mm grid, 2.25 N, 1025/E-BST1-2,25 N-Au-0,62 测试探针 | 12 H 2132 | 12 H 2132 | 实时确认>> |
| 646 | F111.07, probe with plunger tip 07, TD 0.9 mm, steel, nickel 测试探针 | 11 H 5556 | 11 H 5556 | 实时确认>> |
| 647 | Twist-proof spring force contact with probe tip Y1, A 0.97, B 0.63 mm, gold-plated steel, 2.54 mm grid, 1.5 N, 1021/GV-Y1-1,5 N-Au-0,97x0,63 测试探针 | 11 H 4502 | 11 H 4502 | 实时确认>> |
| 648 | Test contact, TF48, 20 A, 4.8 mm 测试探针 | 12 H 1414 | 12 H 1414 | 实时确认>> |
| 649 | Standard spring-loaded contact with tip D, D 0.75 mm, steel, 2.54 mm grid, 1.5 N, 1015-D-1,5 N-Au-0,75 测试探针 | 12 H 2050 | 12 H 2050 | 实时确认>> |
| 650 | F733.06, probe with plunger tip 06, TD 2.3 mm, CuBe, gold 测试探针 | 12 H 1640 | 12 H 1640 | 实时确认>> |
| 651 | High-current spring force probe with tip CX, D 3.0 mm, gold-plated CuBe, 5.0 mm grid, 3.0 N, 1075-CX-3,0 N-Au-3,0C 测试探针 | 12 H 2262 | 12 H 2262 | 实时确认>> |
| 652 | FWZ732, probe insertion tool, for screwing 测试探头附件 | 12 H 1630 | 12 H 1630 | 实时确认>> |
| 653 | Threaded spring force contact with probe tip H, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-H-1,5 N-Au-1,8 测试探针 | 11 H 4420 | 11 H 4420 | 实时确认>> |
| 654 | Non-perforated contact carrier plate, E 2, 100 x 160 mm 测试探针 | 12 H 2004 | 12 H 2004 | 实时确认>> |
| 655 | ICT spring force contact with probe tip B, D 0.8 mm, steel, 2.54 mm grid, 2.25 N, 2021-B-2,25 N-Ni-0,8 测试探针 | 12 H 2061 | 12 H 2061 | 实时确认>> |
| 656 | Charging and battery contact, 2.54 mm, TK0068B, gold-plated steel tip, 3.0 A 测试探针 | 12 H 1363 | 12 H 1363 | 实时确认>> |
| 657 | Triple probe for Testo 435-2, 435-4, 0635 1535 温度计和湿度计 | 21 K 799 | 21 K 799 | 实时确认>> |
| 658 | F585.11B105G200, probe with plunger tip 11, TD 1.05 mm, CuBe, gold 测试探针 | 11 H 5682 | 11 H 5682 | 实时确认>> |
| 659 | F670.12, probe with plunger tip 12, TD 2.0 mm, CuBe, gold 测试探针 | 11 H 5852 | 11 H 5852 | 实时确认>> |
| 660 | Switching probe, plunger tip 06, F885.06LM, 200 cN, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 4805 | 11 H 4805 | 实时确认>> |
| 661 | F100.21S090L200, probe with plunger tip 21, TD 0.9 mm, steel, gold 测试探针 | 11 H 5709 | 11 H 5709 | 实时确认>> |
| 662 | ICT spring force contact with probe tip B, D 0.9 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-B-1,5 N-Au-0,9 测试探针 | 12 H 2152 | 12 H 2152 | 实时确认>> |
| 663 | Threaded spring force contact with probe tip C, D 4.0 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-C-1,5 N-Au-4,0 测试探针 | 11 H 4473 | 11 H 4473 | 实时确认>> |
| 664 | Threaded spring force contact with probe tip D, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-D-1,5 N-Ni-1,8 测试探针 | 11 H 4444 | 11 H 4444 | 实时确认>> |
| 665 | Switched spring contact with probe tip F1, D 3.0 mm, gold-plated steel, 4.0 mm grid, 2.3 N, 3010/2-F1-2,3 N-Au-3,0/1,0x4,0 测试探针 | 12 H 2122 | 12 H 2122 | 实时确认>> |
| 666 | F702.11, probe with plunger tip 11, TD 1.3 mm, CuBe, gold 测试探针 | 11 H 5870 | 11 H 5870 | 实时确认>> |
| 667 | Temperature probe with angled plug, NiCr-Ni, type K, –50 to +1150 °C, 400 mm, GTF 104 NiCr-Ni 温度计和湿度计 | 22 K 1307 | 22 K 1307 | 实时确认>> |
| 668 | Probe F330.07, with plunger tip 07, TD 2.1 mm, steel, nickel 测试探针 | 11 H 5954 | 11 H 5954 | 实时确认>> |
| 669 | F773.17, probe with plunger tip 17, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 4664 | 11 H 4664 | 实时确认>> |
| 670 | Battery charging and interface contact with probe tip G, D 1.3 mm, gold-plated CuBe, 3.0 mm grid, 2.0 N, 5099-G-2,0 N-Au-1,3C 测试探针 | 11 H 4952 | 11 H 4952 | 实时确认>> |
| 671 | F886.17SM, switching probe, plunger tip 17, TD 3.0 mm, uncoated plastic 测试探针 | 12 H 5050 | 12 H 5050 | 实时确认>> |
| 672 | ICT spring force contact with probe tip B, D 0.9 mm, steel, 2.54 mm grid, 2.25 N, 1025/E-B-2,25 N-Au-0,9 测试探针 | 12 H 2130 | 12 H 2130 | 实时确认>> |
| 673 | High-current spring force probe with tip FX, D 4.0 mm, gold-plated CuBe, 5.0 mm grid, 3.0 N, 1075-FX-3,0 N-Au-4,0C 测试探针 | 12 H 2266 | 12 H 2266 | 实时确认>> |
| 674 | Switching probe, plunger tip 17, F885.17SM, 200 cN, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4807 | 11 H 4807 | 实时确认>> |
| 675 | F772.07, probe with plunger tip 07, TD 2.0 mm, steel, long-life gold 测试探针 | 12 H 1518 | 12 H 1518 | 实时确认>> |
| 676 | ICT spring force contact with probe tip Q, D 0.5 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-Q-1,5 N-Au-0,5C 测试探针 | 12 H 2432 | 12 H 2432 | 实时确认>> |
| 677 | F681.29, probe with plunger tip 29 测试探针 | 11 H 5510 | 11 H 5510 | 实时确认>> |
| 678 | Switching probe, plunger tip 06, F885.06SM, 350 cN, TD 1.0 mm, CuBe, gold 测试探针 | 12 H 1700 | 12 H 1700 | 实时确认>> |
| 679 | MICROGRIP-XB, test probe, black 测试剪辑 | 35 F 2282 | 35 F 2282 | 实时确认>> |
| 680 | Test probe, PP-115/4, red 测试探针 | 35 F 1608 | 35 F 1608 | 实时确认>> |
| 681 | Test probe, SPP4-L, black 测试探针 | 35 F 1595 | 35 F 1595 | 实时确认>> |
| 682 | Test probe, PP-115/4, blue 测试探针 | 35 F 1607 | 35 F 1607 | 实时确认>> |
| 683 | Test probe, 4690-0, 0.76 mm jack, black 测试探针 | 34 F 220 | 34 F 220 | 实时确认>> |
| 684 | Test probe, PRUEF 2700, black 测试探针 | 35 F 1192 | 35 F 1192 | 实时确认>> |
| 685 | Clamp-type test probe, KLEPS 250, black 测试剪辑 | 35 F 212 | 35 F 212 | 实时确认>> |
| 686 | Test probe, 2-265, black 测试探针 | 35 F 112 | 35 F 112 | 实时确认>> |
| 687 | Test probe, MICRO-PRUEF MPS 2 0,64 FT, red 测试探针 | 35 F 1134 | 35 F 1134 | 实时确认>> |
| 688 | Clamp-type test probe, KLEPS 2800, black 测试剪辑 | 35 F 2210 | 35 F 2210 | 实时确认>> |
| 689 | Clamp-type test probe, KLEPS 2700, black 测试剪辑 | 35 F 2208 | 35 F 2208 | 实时确认>> |
| 690 | Clamp-type test probe, KLEPS 2900, black 测试剪辑 | 35 F 2214 | 35 F 2214 | 实时确认>> |
| 691 | Clamp-type test probe, KLEPS 2700, red 测试剪辑 | 35 F 2209 | 35 F 2209 | 实时确认>> |
| 692 | 5243-2, clamp-type test probe, red 测试剪辑 | 34 F 132 | 34 F 132 | 实时确认>> |
| 693 | Clamp-type test probe, KLEPS 250, red 测试剪辑 | 35 F 214 | 35 F 214 | 实时确认>> |
| 694 | Clamp-type test probe, KLEPS 30, black 测试剪辑 | 35 F 200 | 35 F 200 | 实时确认>> |
| 695 | Miniature clamp-type test probe, KLEPS 064 PCH, white 测试剪辑 | 35 F 2350 | 35 F 2350 | 实时确认>> |
| 696 | Clamp-type test probe, KLEPS 60, black 测试剪辑 | 35 F 219 | 35 F 219 | 实时确认>> |
| 697 | Miniature clamp-type test probe, KLEPS 064 PCH, green 测试剪辑 | 35 F 2348 | 35 F 2348 | 实时确认>> |
| 698 | Test probe, MPS 1, red 测试探针 | 35 F 118 | 35 F 118 | 实时确认>> |
| 699 | Test probe, PRUEF 2600, red 测试探针 | 35 F 1190 | 35 F 1190 | 实时确认>> |
| 700 | 5418-2, clamp-type test probe, red 测试剪辑 | 34 F 142 | 34 F 142 | 实时确认>> |
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