11 H 4952 测试探针

11 H 4952 测试探针-产品快照

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11 H 4952
型号:
11 H 4952

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11 H 4952 测试探针

Battery charging and interface contact with probe tip G, D 1.3 mm, gold-plated CuBe, 3.0 mm grid, 2.0 N, 5099-G-2,0 N-Au-1,3C

11 H 4952

Battery charging and interface contacts, type PTR 5. Design C: universal serrated tip (honeycomb), for straight and bent hook-up wires on wire-wrap posts or connector terminals. Design D: round head, suited particularly for careful testing of PCBs and mechanical components. Design E: conical shaft with 90° tip, good contact properties, for PCB traces, through-plating, pads etc.. Design F: flat head, suitable especially for convex and clean connecting parts for preventing surface damage. V: lance with aggressive tip, for open and closed vias, as well as planar contact areas; penetrates flux and dirt. Test probes with probe tip, type 5099. Grid: 3.0 mm. Maximum travel: 1.2 mm. Working stroke: 1.0 mm. Spring force at working stroke (±20 %): 2.0 N. Spring prestress: 0.3 N. Current load: max. 5.0 to 8.0 A. Contact resistance: typ. 10 mohm. Barrel: gold-plated brass. Spring: gold-plated spring steel. Technical attributes (type, tip shape, tip diameter, plunger material): 5099-G-2,0 N-Au-1,3C, G, D 1.3 mm, gold-plated CuBe

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Test probes

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