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Feinmetall | 德国 | 探针 | Feinmetall供应商 |
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链到 35717 个记录:
| 记录 | 名称, 品牌, 型号 | 实时确认 | ||
|---|---|---|---|---|
| 1001 | F100.06B150G300, probe with plunger tip 06, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5725 | 11 H 5725 | 实时确认>> |
| 1002 | Threaded spring force contact with probe tip C, D 3.0 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-C-1,5 N-Au-3,0 测试探针 | 11 H 4472 | 11 H 4472 | 实时确认>> |
| 1003 | Immersion/penetration probe, for Testo 720, 609 1273 温度计和湿度计 | 21 K 792 | 21 K 792 | 实时确认>> |
| 1004 | Charging and battery contact 1.27 mm, TK0069B, tip B, 3.0 A, 1.0 mm, 0.8 mm 测试探针 | 12 H 1365 | 12 H 1365 | 实时确认>> |
| 1005 | FWZ886, probe insertion tool, for screwing 测试探头附件 | 12 H 1760 | 12 H 1760 | 实时确认>> |
| 1006 | High-current spring force probe with tip CX, D 3.0 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 160-CX-3,0 N-Au-3,0C 测试探针 | 12 H 2300 | 12 H 2300 | 实时确认>> |
| 1007 | Probe with plunger tip 01, F207.01 测试探针 | 11 H 4604 | 11 H 4604 | 实时确认>> |
| 1008 | Interface probe, F504.03, with tip 03 测试探针 | 11 H 4600 | 11 H 4600 | 实时确认>> |
| 1009 | Air probe, for Testo 176 T2 and Testo 720, 0609 1773 温度计和湿度计 | 21 K 788 | 21 K 788 | 实时确认>> |
| 1010 | Passive probe RT-ZP03, 1:1 (10MHz), 10:1 (300MHz) 测试探针 | 20 K 476 | 20 K 476 | 实时确认>> |
| 1011 | Switching probe, plunger tip 06, F885.06LM, 350 cN, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4813 | 11 H 4813 | 实时确认>> |
| 1012 | F100.07S150L200, probe with plunger tip 07, TD 1.5 mm, steel, long-life gold 测试探针 | 11 H 5687 | 11 H 5687 | 实时确认>> |
| 1013 | ICT spring force contact with probe tip Q, D 1.3 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-Q-1,5 N-Au-1,3 测试探针 | 12 H 2170 | 12 H 2170 | 实时确认>> |
| 1014 | Standard spring-loaded contact with tip B, D 0.45 mm, steel, 1.91 mm grid, 0.8 N, 1010-B-0,8 N-Au-0.45 测试探针 | 12 H 2021 | 12 H 2021 | 实时确认>> |
| 1015 | F585.10S063L300, probe with plunger tip 10, TD 0.63 mm, steel, long-life gold 测试探针 | 11 H 5680 | 11 H 5680 | 实时确认>> |
| 1016 | ICT spring force contact with probe tip C, D 1.3 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-C-1,5 N-Au-1,3 测试探针 | 12 H 2156 | 12 H 2156 | 实时确认>> |
| 1017 | ICT spring force contact with probe tip Q5, D 1.06 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-Q5-1,5 N-Au-1,06 测试探针 | 12 H 2470 | 12 H 2470 | 实时确认>> |
| 1018 | Receptacle for probe series 1060, with solder connection, H 1050 L 测试探头附件 | 12 H 2316 | 12 H 2316 | 实时确认>> |
| 1019 | F588.15, probe with plunger tip 15, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5733 | 11 H 5733 | 实时确认>> |
| 1020 | Threaded spring contact with tip B, D 0.4 mm, gold-plated CuBe, 1.27 mm grid, 1.1 N, 1007/G-B-1,1 N-Au-0,4C 测试探针 | 12 H 2180 | 12 H 2180 | 实时确认>> |
| 1021 | F875.05, switching probe, plunger tip 05, TD 1.8 mm, CuBe, gold 测试探针 | 12 H 1670 | 12 H 1670 | 实时确认>> |
| 1022 | F772.06, probe with plunger tip 06, TD 2.5 mm, CuBe, gold 测试探针 | 11 H 4634 | 11 H 4634 | 实时确认>> |
| 1023 | F100.36S130L300, probe with plunger tip 36, TD 1.3 mm, steel, long-life gold 测试探针 | 11 H 5721 | 11 H 5721 | 实时确认>> |
| 1024 | Threaded spring force contact with probe tip K, D 2.0 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-K-1,5 N-Rh-2,0 测试探针 | 11 H 4458 | 11 H 4458 | 实时确认>> |
| 1025 | Battery charging and interface contact with probe tip E, D 2.3 mm, CuBe, 4.0 mm grid, 1.2 N, 5110/S.02-E-1.2 N-Au-2,3C 测试探针 | 12 H 2366 | 12 H 2366 | 实时确认>> |
| 1026 | Switching probe, plunger tip 06, F885.06LM, 350 cN, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 4815 | 11 H 4815 | 实时确认>> |
| 1027 | Standard spring-loaded contact with tip A, D 1.5 mm, steel, 1.91 mm grid, 0.8 N, 1010-A-0,8 N-Au-1,5 测试探针 | 12 H 2020 | 12 H 2020 | 实时确认>> |
| 1028 | Standard spring-loaded contact with tip B, D 0.49 mm, steel, 1.27 mm grid, 0.7 N, 1007-A-0.7 N-Au-0.49 mm 测试探针 | 12 H 1803 | 12 H 1803 | 实时确认>> |
| 1029 | F730.17, probe with plunger tip 17, TD 0.64 mm, CuBe, gold 测试探针 | 11 H 4681 | 11 H 4681 | 实时确认>> |
| 1030 | F075.06B120G150, probe with plunger tip 06, TD 1.2 mm, CuBe, gold 测试探针 | 11 H 5642 | 11 H 5642 | 实时确认>> |
| 1031 | F588.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5732 | 11 H 5732 | 实时确认>> |
| 1032 | ICT spring force contact with probe tip C, D 1.5 mm, CuBe, 2.54 mm grid, 2.25 N, 1025/E-C-2,25 N-Au-1,5C 测试探针 | 12 H 2134 | 12 H 2134 | 实时确认>> |
| 1033 | F875.16L, switching probe, plunger tip 16, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4770 | 11 H 4770 | 实时确认>> |
| 1034 | F732.06, probe with plunger tip 06, TD 2.5 mm, CuBe, gold 测试探针 | 11 H 4726 | 11 H 4726 | 实时确认>> |
| 1035 | F238.01, test probe with tip 01 测试探针 | 11 H 5500 | 11 H 5500 | 实时确认>> |
| 1036 | Standard spring-loaded contact with tip D, D 1.25 mm, steel, 2.54 mm grid, 1.5 N, 1015-D-1,5 N-Au-1.25 测试探针 | 12 H 2051 | 12 H 2051 | 实时确认>> |
| 1037 | Contact pin strip, WWS-Z, 36-pole, H 12 mm 测试探针 | 12 H 6153 | 12 H 6153 | 实时确认>> |
| 1038 | Battery charging and interface contact with probe tip D, D 2.3 mm, CuBe, 4.0 mm grid, 1.2 N, 5110/S.02-D-1.2 N-Au-2,3C 测试探针 | 12 H 2364 | 12 H 2364 | 实时确认>> |
| 1039 | Threaded spring contact with tip D, D 0.64 mm, gold-plated CuBe, 1.27 mm grid, 1.1 N, 1007/G-D-1,1 N-Au-0,64C 测试探针 | 12 H 2184 | 12 H 2184 | 实时确认>> |
| 1040 | High-current spring force contact with probe tip CX, D 4.0 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 1060/G-CX-3,0 N-Au-4,0C 测试探针 | 12 H 2322 | 12 H 2322 | 实时确认>> |
| 1041 | F732.18, probe with plunger tip 18, TD 1.3 mm, CuBe, gold 测试探针 | 12 H 1626 | 12 H 1626 | 实时确认>> |
| 1042 | ICT spring force contact with probe tip D, D 0.64 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-D-1,5 N-Au-0,64C 测试探针 | 12 H 2426 | 12 H 2426 | 实时确认>> |
| 1043 | F773.12, probe with plunger tip 12, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 5771 | 11 H 5771 | 实时确认>> |
| 1044 | H730LA, receptacle for probe F730 测试探头附件 | 11 H 4683 | 11 H 4683 | 实时确认>> |
| 1045 | F732.05, probe with plunger tip 05, TD 2.0 mm, CuBe, gold 测试探针 | 11 H 4721 | 11 H 4721 | 实时确认>> |
| 1046 | Probe F340.14, with plunger tip 14, TD 3.5 mm, steel, nickel 测试探针 | 11 H 5978 | 11 H 5978 | 实时确认>> |
| 1047 | F886.17SM, switching probe, plunger tip 17, TD 4.5 mm, uncoated Host. 测试探针 | 12 H 5053 | 12 H 5053 | 实时确认>> |
| 1048 | ICT spring force contact with probe tip Q, D 1.3 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-Q-1,5 N-Au-1,3 测试探针 | 12 H 2468 | 12 H 2468 | 实时确认>> |
| 1049 | F875.11, switching probe, plunger tip 11, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4766 | 11 H 4766 | 实时确认>> |
| 1050 | F875.17, switching probe, plunger tip 17, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4760 | 11 H 4760 | 实时确认>> |
| 1051 | Surface probe, type K, 80PK-3A 温度计和湿度计配件 | 21 K 425 | 21 K 425 | 实时确认>> |
| 1052 | F772.17, probe with plunger tip 17, TD 2.0 mm, CuBe, gold 测试探针 | 11 H 4636 | 11 H 4636 | 实时确认>> |
| 1053 | H887RD, receptacle for probe F887, collar height 0.2 mm 测试探头附件 | 12 H 1782 | 12 H 1782 | 实时确认>> |
| 1054 | Safety test lead, 4.0 mm, with test probe, SPL 7316 Ni/1/100/SW, black | 86 F 6960 | 86 F 6960 | 实时确认>> |
| 1055 | RF spring force contact for SMB-f, 5.3 N, 3.2, 0.8 mm, screwable, PTR 7860/G-Z8E-5.3N-AU-3.2/0.8C 测试探针 | 12 H 2575 | 12 H 2575 | 实时确认>> |
| 1056 | ICT spring force contact with probe tip V, D 0.9 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-V-1,5 N-Au-0,9 测试探针 | 12 H 2472 | 12 H 2472 | 实时确认>> |
| 1057 | F772.11, probe with plunger tip 11, TD 0.7 mm, CuBe, gold 测试探针 | 11 H 4635 | 11 H 4635 | 实时确认>> |
| 1058 | F100.12B150G200, probe with plunger tip 12, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5678 | 11 H 5678 | 实时确认>> |
| 1059 | Safety test lead, 4.0 mm, with test probe, SPL 7315 Ni/1/100/RT, red | 86 F 6966 | 86 F 6966 | 实时确认>> |
| 1060 | F773.16, probe with plunger tip 16, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 5775 | 11 H 5775 | 实时确认>> |
| 1061 | F732.06, probe with plunger tip 06, TD 1.3 mm, CuBe, gold 测试探针 | 11 H 4722 | 11 H 4722 | 实时确认>> |
| 1062 | F111.14, probe with plunger tip 14, TD 0.9 mm, steel, nickel 测试探针 | 11 H 5562 | 11 H 5562 | 实时确认>> |
| 1063 | High-current spring force probe with tip HX, D 1.8 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 160-HX-3,0 N-Au-1,8C 测试探针 | 12 H 2314 | 12 H 2314 | 实时确认>> |
| 1064 | F100.20B150G200, probe with plunger tip 20, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5699 | 11 H 5699 | 实时确认>> |
| 1065 | F733.06, probe with plunger tip 06, TD 4.0 mm, CuBe, gold 测试探针 | 12 H 1644 | 12 H 1644 | 实时确认>> |
| 1066 | ICT spring force contact with probe tip V, D 0.9 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-V-1,5 N-Au-0,9 测试探针 | 12 H 2174 | 12 H 2174 | 实时确认>> |
| 1067 | F773.06, probe with plunger tip 06, TD 3.0 mm, CuBe, gold 测试探针 | 11 H 4661 | 11 H 4661 | 实时确认>> |
| 1068 | Threaded spring force contact with probe tip D, D 2.0 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-D-1,5 N-Au-2,0 测试探针 | 11 H 4445 | 11 H 4445 | 实时确认>> |
| 1069 | ICT spring force contact with probe tip Q, D 1.3 mm, steel, 2.54 mm grid, 2.25 N, 1025/E-Q-2,25 N-Au-1,3 测试探针 | 12 H 2142 | 12 H 2142 | 实时确认>> |
| 1070 | F788.33, probe with plunger tip 33, TD 0.6 mm, steel, long-life gold 测试探针 | 11 H 5629 | 11 H 5629 | 实时确认>> |
| 1071 | ICT spring force contact with probe tip B, D 0.64 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-B-1,5 N-Au-0,64C 测试探针 | 12 H 2420 | 12 H 2420 | 实时确认>> |
| 1072 | Test lead with test probe, PL 2600 S, black | 86 F 6950 | 86 F 6950 | 实时确认>> |
| 1073 | F585.18S105L200, probe with plunger tip 18, TD 1.05 mm, steel, long-life gold 测试探针 | 11 H 5697 | 11 H 5697 | 实时确认>> |
| 1074 | Safety test probe set, replaceable inserts, 6-piece, SET SPS 2040/RT, red 测试探针 | 35 F 1202 | 35 F 1202 | 实时确认>> |
| 1075 | F875.17, switching probe, plunger tip 17, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4751 | 11 H 4751 | 实时确认>> |
| 1076 | Probe with plunger tip 11, TD 1.3 mm, CuBe, gold, solder-proof, F706.11B130G150ST 测试探针 | 11 H 5876 | 11 H 5876 | 实时确认>> |
| 1077 | ICT spring force contact with probe tip B, D 0.64 mm, steel, 1.91 mm grid, 1.5 N, 1012/E-B-1,5 N-Au-0,64 测试探针 | 12 H 2010 | 12 H 2010 | 实时确认>> |
| 1078 | F732.17, probe with plunger tip 17, TD 1.5 mm, CuBe, gold 测试探针 | 12 H 1625 | 12 H 1625 | 实时确认>> |
| 1079 | High-current spring force probe with tip FX, D 2.3 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 160-CX-3,0 N-Au-3,0C 测试探针 | 12 H 2308 | 12 H 2308 | 实时确认>> |
| 1080 | F732.11, probe with plunger tip 11, TD 0.8 mm, CuBe, gold 测试探针 | 12 H 1614 | 12 H 1614 | 实时确认>> |
| 1081 | High-current spring force probe with tip CX, D 4.0 mm, gold-plated CuBe, 5.0 mm grid, 3.0 N, 1075-CX-3,0 N-Au-4,0C 测试探针 | 12 H 2264 | 12 H 2264 | 实时确认>> |
| 1082 | Switching probe, plunger tip 06, F885.06LM, 200 cN, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4801 | 11 H 4801 | 实时确认>> |
| 1083 | Threaded spring force contact with probe tip D, D 1.25 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-D-1,5 N-Au-1.25 测试探针 | 11 H 4412 | 11 H 4412 | 实时确认>> |
| 1084 | F875.16, switching probe, plunger tip 16, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4769 | 11 H 4769 | 实时确认>> |
| 1085 | Charging and battery contact, 2.7 mm, TK0054B.05.1.30.C.100.A, 100 cN, 1.5 A 测试探针 | 12 H 1382 | 12 H 1382 | 实时确认>> |
| 1086 | F773.06C, probe with plunger tip 06, TD 4.0 mm, CuBe, gold 测试探针 | 11 H 5781 | 11 H 5781 | 实时确认>> |
| 1087 | ICT spring force contact with probe tip Q, D 0.5 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-Q-1,5 N-Au-0,5 测试探针 | 12 H 2464 | 12 H 2464 | 实时确认>> |
| 1088 | Plug-in receptacle for probe series 1040, H 1040 测试探头附件 | 12 H 2098 | 12 H 2098 | 实时确认>> |
| 1089 | Threaded spring force contact with probe tip A, D 4.0 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-A-1,5 N-Au-4,0 测试探针 | 11 H 4466 | 11 H 4466 | 实时确认>> |
| 1090 | Non-perforated contact carrier plate, E 3, 200 x 160 mm 测试探针 | 12 H 2006 | 12 H 2006 | 实时确认>> |
| 1091 | H563LA, receptacle for probe F563, solder connection 测试探头附件 | 12 H 1568 | 12 H 1568 | 实时确认>> |
| 1092 | High-current spring force contact with probe tip FX, D 4.0 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 1060/G-FX-3,0 N-Au-4,0C 测试探针 | 12 H 2330 | 12 H 2330 | 实时确认>> |
| 1093 | ICT spring force contact with probe tip BST1, D 0.64 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-BST1-1,5 N-Au-0,64C 测试探针 | 12 H 2422 | 12 H 2422 | 实时确认>> |
| 1094 | Pneumatic spring force contact with probe tip A, D 3.0 mm, steel, 4.0 mm grid, 1.5 N, 4004-A-1,5 N-Rh-3,0 测试探针 | 12 H 2520 | 12 H 2520 | 实时确认>> |
| 1095 | High-current spring force probe with tip CX, D 2.0 mm, gold-plated CuBe, 2.54 mm grid, 3.0 N, 1021-CX-3,0 N-Au-2,0C 测试探针 | 12 H 2230 | 12 H 2230 | 实时确认>> |
| 1096 | F875.16, switching probe, plunger tip 16, TD 0.64 mm, CuBe, gold 测试探针 | 11 H 4767 | 11 H 4767 | 实时确认>> |
| 1097 | F100.21S090L300, probe with plunger tip 21, TD 0.9 mm, steel, long-life gold 测试探针 | 11 H 4622 | 11 H 4622 | 实时确认>> |
| 1098 | Receptacle for probe series 1007, with solder connection, H 1007 L 测试探头附件 | 12 H 1808 | 12 H 1808 | 实时确认>> |
| 1099 | KSL 214 Z, contact pin, 21.4 mm 测试探针 | 12 H 591 | 12 H 591 | 实时确认>> |
| 1100 | Threaded spring contact with tip C, D 0.9 mm, gold-plated CuBe, 1.27 mm grid, 1.1 N, 1007/G-C-1,1 N-Au-0,9C 测试探针 | 12 H 2182 | 12 H 2182 | 实时确认>> |
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