12 H 2184 测试探针-产品快照
- 品牌:
- 12 H 2184
- 型号:
- 12 H 2184
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| 供应商名称 | 电话 | 备注 |
|---|---|---|
| 暂无展示，可咨询在线客服 | 400-811-6961 |
 微信咨询，as10@gchane.com , QQ3350168184
|
产品介绍
12 H 2184 测试探针
Threaded spring contact with tip D, D 0.64 mm, gold-plated CuBe, 1.27 mm grid, 1.1 N, 1007/G-D-1,1 N-Au-0,64C
12 H 2184
High-current threaded spring force contacts, type PTR 10. Design A: concave 90°. For connector pins, wire-wrap posts and straight / bent terminals. To be used on clean PCB because of the risk of contamination. W: pointed tip 30°, for PCB traces, through-plating, solder joints, and test pads. Design BS: practical flexible needle, point-of use reliable penetration of flux and coiling on unwashed PCBs or modules, or for contacting SMD. Design BST: sharp steel needle with endurance for reliable penetration of flux and dirt on uncleaned PCBs or modules and for SMD contacts. Design C: serrated, A universal head for straight or curved hookup wires, wire-wrap posts and connector pins. Design CS: serrated, with overlapping plastic insulation, presence test of component connections. The overlapping plastic insulation prevents electrical contact in places where the connection is missing. Design D: round head, for contacting PCB traces and contact surfaces. The round tip does not leave marks on the contact surface. Also used to contact socket contacts in connectors. Design E: convex, for clean vias or connector sockets. Design F: flat tip, used on tabs and clean convex contact surfaces to avoid damage to the surface. Design G: four-point crown, for hookup wires, solder joints and test pads without heavy contamination. Design H: pyramid, contact to plated through-holes without problems, also suitable for use on objects with flux residue. Design K: hexagonal, similar to H, but more aggressive and with higher contact reliability. Also used with rotary spring force contacts, cuts through oxide layers and dirt. Design M: crown, with overlapping center tip. The crown and central tip combination ensures reliable contact at almost any test point. The overlapping center tip fixes the probe tip. Design Q: 4-point crown, self-cleaning, for contacting on heavily soiled PCBs. The special cut of the tip discharges dirt to the outside. Threaded test probes with probe tip series 1007/G. Grid: 1.27 mm. Maximum travel: 5.0 mm. Working travel: 4.0 mm. Spring force at working stroke (±20 %): 1.1 N. Spring prestress: 0.2 N. Current load capacity: 3.0 A. Contact resistance: typ. 50 mohm. Barrel: gold-plated bronze. Spring: gold-plated spring steel. Technical attributes (type, tip shape, tip diameter, plunger material): 1007/G-D-1,1 N-Au-0,64C, D, D 0.64 mm, gold-plated CuBe
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Test probes
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