Interconnect Devices, Inc. Test Connectors >> S-0-UT-2.2-G 连接器测试连接器弹簧测试探针-产品快照
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- Interconnect Devices, Inc. Test Connectors >>
- 型号:
- S-0-UT-2.2-G
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Interconnect Devices, Inc. Test Connectors >> S-0-UT-2.2-G 连接器测试连接器弹簧测试探针
Interconnect Devices, Inc. S-0-UT-2.2-G
Interconnect Devices, Inc. Test Connectors >>
SERIES S, SIZE 0, TAPERED CROWN, 2.2 SPRING FORCE, GOLD PLATED PLUNGER
Brand/Series : S Series Centerline, Spacing : 0.050 (1.27) In.(mm) In.(mm) Contact Resistance : 35 Milliohms (Max.) Milliohms (Max.) Force, Spring : 2.2 Oz. Oz. Gender : Probe Length, Overall : 0.66 In. In. Material, Barrel : Nickel/Silver Material, Plating : Gold Plated (Plunger) Material, Plunger : Beryllium Copper Material, Spring : Beryllium Copper Maximum Travel : 0.1 In. Minimum Centers : 0.05 In. Primary Type : Probe Size : Size 0 Tip Style : UT Type : General Purpose
Connectors Test Connectors Spring Test Probes