Interconnect Devices, Inc. Test Connectors >> S-0-B-3.7-G 连接器测试连接器弹簧测试探针-产品快照
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- Interconnect Devices, Inc. Test Connectors >>
- 型号:
- S-0-B-3.7-G
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Interconnect Devices, Inc. Test Connectors >> S-0-B-3.7-G 连接器测试连接器弹簧测试探针
Interconnect Devices, Inc. S-0-B-3.7-G
Interconnect Devices, Inc. Test Connectors >>
0.050 INCH CENTERLINE SPACING SPRING CONTACT PROBE 30 DEGREE SPEAR TIP Overview Single Ended Non-Rotating Coax Probes, 3 A Continuous Current Rating Minimum center 0.050 " Maximum travel 0.1 " Probe with gold plated plunger material.
Brand/Series : S Series Centerline, Spacing : 0.050 (1.27) In.(mm) In.(mm) Contact Resistance : 35 Milliohms (Max.) Milliohms (Max.) Diameter, Mounting Hole : 0.021 in. Force, Spring : 3.7 Oz. Oz. Gender : Probe Length, Overall : 0.66 In. In. Material, Barrel : Nickel/Silver Material, Plating : Gold Plated (Plunger) Material, Plunger : Beryllium Copper Material, Spring : Music Wire Maximum Travel : 0.1 In. Minimum Centers : 0.05 In. Primary Type : Probe Size : Size 0 Tip Style : B - Spear 30 Deg Type : General Purpose Working Travel : 0.07
Connectors Test Connectors Spring Test Probes