11 H 5575 测试探针-产品快照
- 品牌:
- 11 H 5575
- 型号:
- 11 H 5575
* 所有产品信息均源于第三方公开数据或用户上传，工业链仅整合供参考，真实价格货期请联系供应商确认.
| 供应商名称 | 电话 | 备注 |
|---|---|---|
| 暂无展示，可咨询在线客服 | 400-811-6961 |
 微信咨询，as10@gchane.com , QQ3350168184
|
产品介绍
11 H 5575 测试探针
F767.21, probe with plunger tip 21, TD 0.6 mm, steel, long-life gold
11 H 5575
Primarily for fully loaded PCBs (SMD as well). Highly versatile and universal test probe. Receptacle H787 with pressure ring for variable projection height. Projection height F767/F768: 5.6 to 13.6/8.0 to 16 mm (H787), 10.0 mm (H768). Maximum spring travel F767/768: 8.0/4.0 mm. Recommended spring travel: F767/F768: 6.4/3.2 mm. P restress F767/F768: 35/40 cN. Spring force at recommended spring travel: F767/F768: 165/130 cN ±20 %. Contact tolerance F767/F768: ±0.05/±0.07 mm. Operating temperatures: –20 to +80 °C. Maximum continuous current: 2.0 A. Typical contact resistance: 30 mohm. Barrel: gold-plated bronze. Spring: gold-plated spring steel. Tip designs: 06 serrated (honeycomb), 07 hexagonal (fluted star) 90°, 11 round tip, 18 conical shaft (spear) 30°, 21 four-point crown head (self-cleaning), 33 lance shaft (dagger). Table index: type, plunger with tip design, tip diameter TD, material, finish (long-life gold for particularly long tool life). Type : F767.21, probe with plunger tip 21, TD 0.6 mm, steel, long–life gold
We order for you. Clicking on the "Add to cart" button will initiate your order. 287 220 88 167 717 orderable orderable
Test probes
更多产品:
更多品牌:
