11 H 5584 测试探针-产品快照
- 品牌:
- 11 H 5584
- 型号:
- 11 H 5584
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| 供应商名称 | 电话 | 备注 |
|---|---|---|
| 暂无展示，可咨询在线客服 | 400-811-6961 |
 微信咨询，cs11@gchane.com , QQ1429311537
|
产品介绍
11 H 5584 测试探针
F768.07, probe with plunger tip 07, TD 0.9 mm, steel, long-life gold
11 H 5584
Primarily for fully loaded PCBs (SMD as well). Highly versatile and universal test probe. Receptacle H787 with pressure ring for variable projection height. Projection height F767/F768: 5.6 to 13.6/8.0 to 16 mm (H787), 10.0 mm (H768). Maximum spring travel F767/768: 8.0/4.0 mm. Recommended spring travel: F767/F768: 6.4/3.2 mm. P restress F767/F768: 35/40 cN. Spring force at recommended spring travel: F767/F768: 165/130 cN ±20 %. Contact tolerance F767/F768: ±0.05/±0.07 mm. Operating temperatures: –20 to +80 °C. Maximum continuous current: 2.0 A. Typical contact resistance: 30 mohm. Barrel: gold-plated bronze. Spring: gold-plated spring steel. Tip designs: 06 serrated (honeycomb), 07 hexagonal (fluted star) 90°, 11 round tip, 18 conical shaft (spear) 30°, 21 four-point crown head (self-cleaning), 33 lance shaft (dagger). Table index: type, plunger with tip design, tip diameter TD, material, finish (long-life gold for particularly long tool life). Type : F768.07, probe with plunger tip 07, TD 0.9 mm, steel, long–life gold
There are 167 piece in stock orderable 287 220 88 717 orderable orderable
Test probes
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