12 H 2512 测试探针-产品快照
- 品牌:
- 12 H 2512
- 型号:
- 12 H 2512
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| 供应商名称 | 电话 | 备注 |
|---|---|---|
| 暂无展示，可咨询在线客服 | 400-811-6961 |
 微信咨询，cs11@gchane.com , QQ1429311537
|
产品介绍
12 H 2512 测试探针
Switched spring contact with probe tip F, D 3.0 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 3014/2G-F-1,5 N-Au-3,0C
12 H 2512
Precision switching spring contacts, type PTR 30. Design A: 90° concave, for plug pins, wire-wrap posts and straight or bent terminals. Used preferably only for cleaned PCBs because of the risk of soiling. Design C: universal serrated tip (honeycomb) for straight and bent hook-up wires, wire-wrap posts and connector terminals. Design D: round head, for contacting PCB traces and contact surfaces without leaving marks. Also used for socket contacts in connectors. Design F: flat head, suitable especially for convex and clean connecting parts to prevent surface damage. Test probes with probe tip, type 3014/2G. With rapid-change system; Grid: 4.0 mm. Maximum travel: 5.0 mm. Working travel: 4.0 mm. Switching travel: 1.7 mm. Spring force at working stroke (±20 %): 1.5 N. Spring prestress: 0.5 N. Spring force at switching stroke: 0.9 N. Current load capacity: receptacle-plunger/pin-plunger 3.0/1.0 A. Contact resistance receptacle-plunger/pin-plunger: 20/40 mohm. Barrel: gold-plated brass. Spring: gold-plated spring steel. Technical attributes (type, tip shape, tip diameter, plunger material): 3014/2G-F-1,5 N-Au-3,0C, F, D 3.0 mm, gold-plated CuBe
There are 8 piece in stock 15 orderable orderable 5 orderable 37
Test probes
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