12 H 2092 测试探针-产品快照
- 品牌:
- 12 H 2092
- 型号:
- 12 H 2092
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|---|---|---|
| 暂无展示，可咨询在线客服 | 400-811-6961 |
 微信咨询，as10@gchane.com , QQ3350168184
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产品介绍
12 H 2092 测试探针
Spring contact with tip C, D 4.0 mm, steel, 4.0 mm grid, 1.5 N, 1040-C-1,5 N-Au-4,0
12 H 2092
Spring-force contacts with 4.0 mm grid, type PTR 1040. Design A: 90° concave, for plug pins, wire-wrap posts and straight or bent terminals. Used preferably only for cleaned PCBs because of the risk of soiling. Design B: 30° tip. For PCB traces, vias, solder joints and test pads. Design C: universal serrated tip (honeycomb) for straight and bent hook-up wires, wire-wrap posts and connector terminals. Design D: for contacting PCB traces and contact surfaces. The round tip does not leave marks on the contact surface. For contacting connector socket inserts. Design E: conical, clean vias or sockets in connectors. Design F: flat head, suitable for tabs, cambered and clean contact surfaces, contact without damage to the surface. Test probes with probe tip series 1040. Grid: 4.0 mm. Maximum travel: 5.5 mm. Working travel: 4.4 mm. Working travel spring force (±20 %): 1.5 N. Spring prestress: 0.5 N. Rated current: 5.0 A. Contact resistance: typically 30 mohm. Barrel: gold-plated brass. Spring: gold-plated spring steel. Technical attributes (type, tip shape, tip diameter, plunger material): 1040-C-1,5 N-Au-4,0, C, D 4.0 mm, steel
There are 293 piece in stock 405 125 361 188 1261 65
Test probes
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