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TESTEC TESTEC 德国 探头、探针 TESTEC供应商
Technisonic Technisonic 美国 探头、 超声探头 Technisonic供应商

链到 43697 个记录:

记录 名称, 品牌, 型号 实时确认
801 Temperature probe for iPhone, iPad and iPod touch, –30 to +150 °C, ±0.2 °C, 5020-0002 温度计和湿度计 21 K 7622 21 K 7622 实时确认>>
802 GTF 900, immersion probe –65/+1000 °C 温度计和湿度计 21 K 8656 21 K 8656 实时确认>>
803 0602.1993, NiCr-Ni probe 温度计和湿度计 21 K 8562 21 K 8562 实时确认>>
804 TFS 0100 E, temperature/humidity probe 温度计和湿度计 21 K 8778 21 K 8778 实时确认>>
805 80 K-6, high-voltage probe, 6.0 kV 测试探针 21 K 362 21 K 362 实时确认>>
806 Set of probe tips, TL 910 测试探针 21 K 3174 21 K 3174 实时确认>>
807 GOF 175, surface probe for hard surfaces 温度计和湿度计配件 22 K 1108 22 K 1108 实时确认>>
808 80 BK, thermal probe +260 °C 温度计和湿度计配件 21 K 3100 21 K 3100 实时确认>>
809 GE 7011, probe, 1.2 m 测试探针 20 K 4114 20 K 4114 实时确认>>
810 GE 8115, differential probe 测试探针 20 K 4005 20 K 4005 实时确认>>
811 Near field test probe set, Hameg, HZ530 示波器配件 20 K 496 20 K 496 实时确认>>
812 Probe, 100:1 (100 MHz), HZ 53 测试探针 20 K 479 20 K 479 实时确认>>
813 0602.0393, NiCr-Ni probe 温度计和湿度计 21 K 8560 21 K 8560 实时确认>>
814 80 K-40, high-voltage probe, 40 kV 测试探针 21 K 363 21 K 363 实时确认>>
815 GE 3830, probe, 2.0 m 测试探针 20 K 4103 20 K 4103 实时确认>>
816 TL 75, pair of test leads with test probe 20 K 1036 20 K 1036 实时确认>>
817 TSN100ext, external thermal probe with 10 m cable 数据记录器附件 20 K 360 20 K 360 实时确认>>
818 TSN-EXT44, temperature sensor with external probe 数据记录器附件 20 K 356 20 K 356 实时确认>>
819 Probe, HZO10, 10:1, 1.2 m 测试探针 20 K 4454 20 K 4454 实时确认>>
820 Differential probe 10:1, 200 MHz, HZO40 测试探针 20 K 4456 20 K 4456 实时确认>>
821 GE 5511, probe, 1.2 m 测试探针 20 K 4107 20 K 4107 实时确认>>
822 GE 8100, differential probe 测试探针 20 K 4001 20 K 4001 实时确认>>
823 GE 8109, differential probe 测试探针 20 K 4004 20 K 4004 实时确认>>
824 Probe, 10:1 RF (250 MHz), HZ 52 测试探针 20 K 478 20 K 478 实时确认>>
825 Differential probe 10:1, 800 MHz, HZO41 测试探针 20 K 4458 20 K 4458 实时确认>>
826 GE 3121, probe, 1.5 m 测试探针 20 K 4106 20 K 4106 实时确认>>
827 Probe, 10:1 (150 MHz), HZ 51 测试探针 20 K 477 20 K 477 实时确认>>
828 Protective bag for Hameg HMO722, 724, 1022, 1024, 1522, 1524, 2022, 2024, HZO90 测试探头附件 20 K 4600 20 K 4600 实时确认>>
829 GE 2511, probe, 1.2 m 测试探针 20 K 408 20 K 408 实时确认>>
830 GE 8104, differential probe 测试探针 20 K 4003 20 K 4003 实时确认>>
831 LF 312, probe, 1.2 m 测试探针 20 K 404 20 K 404 实时确认>>
832 HO 3508, 8-channel logic probe 测试探针 20 K 418 20 K 418 实时确认>>
833 Probe 1:1/10:1, HZ 154, 1.2 m 测试探针 20 K 4452 20 K 4452 实时确认>>
834 4-wire test lead HZ 17, with probe tip 20 K 5671 20 K 5671 实时确认>>
835 GE 1511, probe, 1.2 m 测试探针 20 K 402 20 K 402 实时确认>>
836 GE 4512, probe, 1.2 m 测试探针 20 K 4108 20 K 4108 实时确认>>
837 GE 2521, probe, 1.2 m 测试探针 20 K 4102 20 K 4102 实时确认>>
838 Battery charging and interface contact with probe tip C, D 2.3 mm, CuBe, 4.0 mm grid, 1.2 N, 5110/S.02-C-1,2 N-Au-2,3C 测试探针 12 H 2360 12 H 2360 实时确认>>
839 Probe F330.09, with plunger tip 09, TD 2.1 mm, steel, long-life gold 测试探针 11 H 5956 11 H 5956 实时确认>>
840 F886.17SM, switching probe, plunger tip 17, TD 5.5 mm, CuBe, gold 测试探针 12 H 1742 12 H 1742 实时确认>>
841 Threaded spring force contact with probe tip BA, D 1.8 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-BA-1,5 N-Au-1,8 测试探针 11 H 4468 11 H 4468 实时确认>>
842 F703.28B120G180, probe with plunger tip 28, TD 1.2 mm, CuBe, gold 测试探针 11 H 5652 11 H 5652 实时确认>>
843 High-current spring force contact with probe tip FX, D 2.3 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 1060/G-FX-3,0 N-Au-2,3C 测试探针 12 H 2328 12 H 2328 实时确认>>
844 F564.11, probe with plunger tip 11, TD 1.55 mm, CuBe, Rh 测试探针 11 H 4651 11 H 4651 实时确认>>
845 F100.15B150G300, probe with plunger tip 15, TD 1.5 mm, CuBe, gold 测试探针 11 H 4646 11 H 4646 实时确认>>
846 F786.06, probe with plunger tip 06, TD 2.0 mm, CuBe, gold 测试探针 11 H 4638 11 H 4638 实时确认>>
847 Connection element, H207AE 测试探头附件 11 H 4605 11 H 4605 实时确认>>
848 F585.34S080L200, probe with plunger tip 34, TD 0.8 mm, steel, long-life gold 测试探针 11 H 5705 11 H 5705 实时确认>>
849 F100.14B130G200, probe with plunger tip 14, TD 1.3 mm, CuBe, gold 测试探针 11 H 5681 11 H 5681 实时确认>>
850 F788.11, probe with plunger tip 11, TD 0.6 mm, CuBe, gold 测试探针 11 H 5624 11 H 5624 实时确认>>
851 Receptacle for test probes series 1053/G with solder connection, H 1053/GVRV-L 测试探头附件 11 H 4528 11 H 4528 实时确认>>
852 F772.06, probe with plunger tip 06, TD 1.8 mm, CuBe, gold 测试探针 11 H 4632 11 H 4632 实时确认>>
853 Receptacle for probes series 5082, H 5082 测试探头附件 12 H 2395 12 H 2395 实时确认>>
854 Test lead with test probe, PL 2600 S, blue 86 F 6954 86 F 6954 实时确认>>
855 F767.33, probe with plunger tip 33, TD 0.6 mm, steel, long-life gold 测试探针 11 H 5576 11 H 5576 实时确认>>
856 F731.06, probe with plunger tip 06, TD 1.8 mm, CuBe, gold 测试探针 11 H 4711 11 H 4711 实时确认>>
857 Receptacle for test probes series 1015, with round posts D 0.64 mm, H 1015 WR 测试探头附件 12 H 2055 12 H 2055 实时确认>>
858 F566.06, probe with plunger tip 06, TD 4.0 mm, CuBe, Rh 测试探针 11 H 4670 11 H 4670 实时确认>>
859 F732.11, probe with plunger tip 11, TD 1.3 mm, CuBe, gold 测试探针 12 H 1618 12 H 1618 实时确认>>
860 Receptacle for probe series 1015, with solder connection, H 1015 L 测试探头附件 12 H 2046 12 H 2046 实时确认>>
861 F731.06, probe with plunger tip 06, TD 1.3 mm, CuBe, gold 测试探针 11 H 4710 11 H 4710 实时确认>>
862 ICT spring force contact with probe tip G, D 1.3 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-D-1,5 N-Au-1,3 测试探针 12 H 2456 12 H 2456 实时确认>>
863 ICT spring force contact with probe tip C, D 1.5 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-C-1,5 N-Au-1,5 测试探针 12 H 2158 12 H 2158 实时确认>>
864 F585.33S105L300, probe with plunger tip 33, TD 1.05 mm, steel, long-life gold 测试探针 11 H 4628 11 H 4628 实时确认>>
865 H502LA, receptacle for solder connection 测试探头附件 11 H 4601 11 H 4601 实时确认>>
866 F075.15B120G150, probe with plunger tip 15, TD 1.2 mm, CuBe, gold 测试探针 11 H 5651 11 H 5651 实时确认>>
867 H732LARD, receptacle for probes F732, solder connection 测试探头附件 12 H 1628 12 H 1628 实时确认>>
868 Threaded spring force contact with probe tip M, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-M-1,5 N-Rh-1,8 测试探针 11 H 4459 11 H 4459 实时确认>>
869 F887.16, switching probe, plunger tip 16, TD 1.0 mm, CuBe, gold 测试探针 12 H 1776 12 H 1776 实时确认>>
870 F585.64B046G200, probe with plunger tip 64, TD 0.46 mm, CuBe, gold 测试探针 11 H 5707 11 H 5707 实时确认>>
871 H774.LA1, receptacle for test probes F773/F785, solder connection 测试探头附件 11 H 5784 11 H 5784 实时确认>>
872 F875.16, switching probe, plunger tip 16, TD 0.8 mm, CuBe, gold 测试探针 11 H 4768 11 H 4768 实时确认>>
873 Threaded spring force contact with probe tip C, D 2.3 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 5110/G-C-1,5 N-Au-2,3C 测试探针 12 H 2374 12 H 2374 实时确认>>
874 F731.11, probe with plunger tip 11, TD 0.65 mm, CuBe, gold 测试探针 11 H 4709 11 H 4709 实时确认>>
875 F701.11, probe with plunger tip 11, TD 0.5 mm, CuBe, gold 测试探针 12 H 1211 12 H 1211 实时确认>>
876 Threaded spring force contact with probe tip D, D 2.3 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 5110/G-D-1,5 N-Au-2,3C 测试探针 12 H 2378 12 H 2378 实时确认>>
877 F563.18, probe with plunger tip 18, TD 1.3 mm, CuBe, gold 测试探针 12 H 1566 12 H 1566 实时确认>>
878 F100.37S050L300, probe with plunger tip 37, TD 0.5 mm, steel, long-life gold 测试探针 11 H 4624 11 H 4624 实时确认>>
879 Probe F310.09, with plunger tip 09, TD 1.1 mm, steel, long-life gold 测试探针 11 H 5936 11 H 5936 实时确认>>
880 F100.05B150G200, probe with plunger tip 05, TD 1.5 mm, CuBe, gold 测试探针 11 H 5711 11 H 5711 实时确认>>
881 Receptacle for test probes series 3011/2GS and 3012/2GS, H 3011/RK 测试探头附件 11 H 4581 11 H 4581 实时确认>>
882 F111.12, probe with plunger tip 12, TD 0.9 mm, steel, long-life gold 测试探针 11 H 5560 11 H 5560 实时确认>>
883 High-current spring force probe with tip FX, D 6.0 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 160-FX-3,0 N-Au-6,0C 测试探针 12 H 2312 12 H 2312 实时确认>>
884 F100.36S130L200, probe with plunger tip 36, TD 1.37 mm, steel, long-life gold 测试探针 11 H 5703 11 H 5703 实时确认>>
885 F732.15, probe with plunger tip 15, TD 2.0 mm, CuBe, gold 测试探针 12 H 1622 12 H 1622 实时确认>>
886 Receptacle for test probes series 3024/2G with thread, H 3024/GW 测试探头附件 11 H 4556 11 H 4556 实时确认>>
887 F775.17, probe with plunger tip 17, TD 4.0 mm, CuBe, gold 测试探针 12 H 1574 12 H 1574 实时确认>>
888 Threaded spring force contact with probe tip F, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-F-1,5 N-Au-1,8 测试探针 11 H 4450 11 H 4450 实时确认>>
889 F875.11, switching probe, plunger tip 11, TD 0.64 mm, CuBe, gold 测试探针 11 H 4750 11 H 4750 实时确认>>
890 80 PK-24, air probe, type K 温度计和湿度计配件 21 K 426 21 K 426 实时确认>>
891 F109.01, probe with plunger tip 01 测试探针 11 H 5540 11 H 5540 实时确认>>
892 F768.07, probe with plunger tip 07, TD 0.9 mm, steel, long-life gold 测试探针 11 H 5584 11 H 5584 实时确认>>
893 Threaded spring force contact with probe tip E, D 2.3 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 5110/G-E-1,5 N-Au-2,3C 测试探针 12 H 2380 12 H 2380 实时确认>>
894 F722.06, probe with plunger tip 06, TD 1.8 mm, CuBe, gold 测试探针 11 H 4740 11 H 4740 实时确认>>
895 Switching probe, plunger tip 06, F885.06SM, 200 cN, TD 2.3 mm, CuBe, gold 测试探针 11 H 4806 11 H 4806 实时确认>>
896 F732.07, probe with plunger tip 07, TD 1.75 mm, steel, long-life gold 测试探针 12 H 1610 12 H 1610 实时确认>>
897 Temperature probe, 05500, 0.5 mm, 510 mm 温度计和湿度计 22 K 1233 22 K 1233 实时确认>>
898 Immersion-/Penetration probe for testo Saveris 2 数据记录器附件 21 K 7684 21 K 7684 实时确认>>
899 GTO 130 OK, NiCr-Ni surface/air probe 温度计和湿度计 22 K 1360 22 K 1360 实时确认>>
900 F886.17SM, switching probe, plunger tip 17, TD 3.5 mm, uncoated Host. 测试探针 12 H 5059 12 H 5059 实时确认>>

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