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TESTEC | 德国 | 探头、探针 | TESTEC供应商 |
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Technisonic | 美国 | 探头、 超声探头 | Technisonic供应商 |
链到 43697 个记录:
记录 | 名称, 品牌, 型号 | 实时确认 | ||
---|---|---|---|---|
301 | ICT spring force contact with probe tip G, D 1.8 mm, steel, 2.54 mm grid, 2.25 N, 2021-G-2,25 N-Ni-1,8 测试探针 | 12 H 2064 | 12 H 2064 | 实时确认>> |
302 | High-current spring force probe with tip DX, D 1.0 mm, gold-plated CuBe, 2.54 mm grid, 3.0 N, 1021-DX-3,0 N-Au-1,0C 测试探针 | 12 H 2232 | 12 H 2232 | 实时确认>> |
303 | Safety test lead, 4.0 mm, with test probe, SPL 7315 Ni/1/100/SW, black | 86 F 6964 | 86 F 6964 | 实时确认>> |
304 | Probe with plunger tip 29, F680.29 测试探针 | 11 H 5532 | 11 H 5532 | 实时确认>> |
305 | Switched spring contact with probe tip F, D 1.0 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 3014/2G-F-1,5 N-Au-1,0C 测试探针 | 12 H 2508 | 12 H 2508 | 实时确认>> |
306 | ICT rotating test probe with tip HD, D 0.9 mm, steel, 1.27 mm grid, 1.5 N 1008/D-HD-1,5 N-Au-0,9 测试探针 | 12 H 2407 | 12 H 2407 | 实时确认>> |
307 | F733.16, probe with plunger tip 16, TD 1.8 mm, CuBe, gold 测试探针 | 12 H 1656 | 12 H 1656 | 实时确认>> |
308 | IR thermometer with penetration probe, Dualltemp Pro, 5020-0413 温度计和湿度计 | 21 K 8578 | 21 K 8578 | 实时确认>> |
309 | Collector probe as flat contact probe, 1.5 m silicon, FKP 9 温度和湿度控制器附件 | 06 N 7908 | 06 N 7908 | 实时确认>> |
310 | Test lead with test probe, PL 2600 S, red | 86 F 6952 | 86 F 6952 | 实时确认>> |
311 | Pipe surface probe, RFP-500, 549 ohm, with platinum thin-film sensor 温度传感器和湿度传感器 | 06 N 8482 | 06 N 8482 | 实时确认>> |
312 | F772.14, probe with plunger tip 14, TD 2.0 mm, steel, long-life gold 测试探针 | 12 H 1520 | 12 H 1520 | 实时确认>> |
313 | F58518S105L100, probe with plunger tip 18, TD 1.05 mm, steel, long-life gold 测试探针 | 11 H 4655 | 11 H 4655 | 实时确认>> |
314 | F732.12, probe with plunger tip 12, TD 1.4 mm, CuBe, gold 测试探针 | 11 H 4728 | 11 H 4728 | 实时确认>> |
315 | Switched spring contact with probe tip C, D 1.0 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 3014/2G-C-1,5 N-Au-1,0C 测试探针 | 12 H 2502 | 12 H 2502 | 实时确认>> |
316 | Switching probe, plunger tip 17, F885.17SM, 350 cN, TD 2.3 mm, uncoated plastic 测试探针 | 12 H 1720 | 12 H 1720 | 实时确认>> |
317 | F605.01, probe with plunger tip 01, TD 0.5 mm, steel, nickel 测试探针 | 11 H 5813 | 11 H 5813 | 实时确认>> |
318 | F887.17, switching probe, plunger tip 17, TD 3.0 mm, CuBe, gold 测试探针 | 12 H 1780 | 12 H 1780 | 实时确认>> |
319 | FWZ730T, screw-in tool 测试探头附件 | 11 H 4684 | 11 H 4684 | 实时确认>> |
320 | F732.06, probe with plunger tip 06, TD 2.0 mm, CuBe, gold 测试探针 | 12 H 1606 | 12 H 1606 | 实时确认>> |
321 | F722.11, probe with plunger tip 11, TD 0.85 mm, CuBe, gold 测试探针 | 11 H 4742 | 11 H 4742 | 实时确认>> |
322 | F588.21, probe with plunger tip 21, TD 0.76 mm, steel, long-life gold 测试探针 | 11 H 5736 | 11 H 5736 | 实时确认>> |
323 | F886.17SM, switching probe, plunger tip 17, TD 5.9 mm, CuBe, gold 测试探针 | 12 H 5062 | 12 H 5062 | 实时确认>> |
324 | Threaded spring force contact with probe tip C15, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-C15-1,5 N-Au-1,8 测试探针 | 11 H 4408 | 11 H 4408 | 实时确认>> |
325 | High-current spring force probe with tip DX, D 1.0 mm, gold-plated CuBe, 2.54 mm grid, 3.0 N, 1021/G-DX-3,0 N-Au-1,0 测试探针 | 12 H 2242 | 12 H 2242 | 实时确认>> |
326 | Pipe surface probe, RFN-100, 120 ohm, with nickel sensor 温度传感器和湿度传感器 | 06 N 8484 | 06 N 8484 | 实时确认>> |
327 | Test lead with test probe, PLF 400, PVC, blue | 86 F 724 | 86 F 724 | 实时确认>> |
328 | ICT spring force contact with probe tip C, D 1.0 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-C-1,5 N-Au-1,0C 测试探针 | 12 H 2424 | 12 H 2424 | 实时确认>> |
329 | ICT spring force contact with probe tip Q, D 1.15 mm, steel, 1.91 mm grid, 1.5 N, 1012/E-Q-1,5 N-Au-1,15 测试探针 | 12 H 2016 | 12 H 2016 | 实时确认>> |
330 | Receptacle for probes series 3014/2G, H 3014/GR 测试探头附件 | 12 H 2514 | 12 H 2514 | 实时确认>> |
331 | F886.17SM, switching probe, plunger tip 17, TD 5.0 mm, T, uncoated 测试探针 | 12 H 5061 | 12 H 5061 | 实时确认>> |
332 | Threaded spring force contact with probe tip F, D 0.8 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-F-1,5 N-Au-0,8 测试探针 | 11 H 4447 | 11 H 4447 | 实时确认>> |
333 | Inner conductor for RF spring contacts, for 7860..Z8E.., PTR 7860-E-1.3N-AU-0.8C 测试探头附件 | 12 H 2589 | 12 H 2589 | 实时确认>> |
334 | F732.06, probe with plunger tip 06, TD 2.5 mm, CuBe, gold 测试探针 | 12 H 1608 | 12 H 1608 | 实时确认>> |
335 | ICT spring force contact with probe tip M, D 1.3 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-M-1,5 N-Au-1,3 测试探针 | 12 H 2462 | 12 H 2462 | 实时确认>> |
336 | Voltage tester kit, voltage tester T5-1000, probe tip extension L210, T5-1000/L210 KIT 电压测试仪和连续性测试仪 | 22 K 8351 | 22 K 8351 | 实时确认>> |
337 | ICT spring force contact with probe tip V, D 0.64 mm, steel, 1.91 mm grid, 1.5 N, 1012/E-V-1,5 N-Au-0,64 测试探针 | 12 H 2018 | 12 H 2018 | 实时确认>> |
338 | H100.CR/7.6, receptacle for crimp connections 测试探头附件 | 11 H 5715 | 11 H 5715 | 实时确认>> |
339 | Threaded spring force contact with probe tip F, D 1.5 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-F-1,5 N-Au-1,5 测试探针 | 11 H 4415 | 11 H 4415 | 实时确认>> |
340 | Receptacle for series 1009 probes with crimp connection, H 1008 C 测试探头附件 | 12 H 1830 | 12 H 1830 | 实时确认>> |
341 | High-current spring force probe with tip DX, D 3.0 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 160-DX-3,0 N-Au-3,0C 测试探针 | 12 H 2306 | 12 H 2306 | 实时确认>> |
342 | Threaded spring force contact with probe tip C, D 2.5 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-C-1,5 N-Ni-2.5 测试探针 | 11 H 4435 | 11 H 4435 | 实时确认>> |
343 | Inner conductor for RF spring contacts, for 7860..Z2D., PTR 7860-D-1.3N-AU-0.5C 测试探头附件 | 12 H 2584 | 12 H 2584 | 实时确认>> |
344 | F875.16, switching probe, plunger tip 16, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4759 | 11 H 4759 | 实时确认>> |
345 | Battery charging and interface contact with probe tip F, D 2.3 mm, CuBe, 4.0 mm grid, 1.2 N, 5110/S.02-F-1,2 N-Au-2,3C 测试探针 | 12 H 2368 | 12 H 2368 | 实时确认>> |
346 | F702.29, probe with plunger tip 29, TD 1.3 mm, CuBe, gold 测试探针 | 11 H 5871 | 11 H 5871 | 实时确认>> |
347 | F733.11, probe with plunger tip 11, TD 1.4 mm, CuBe, gold 测试探针 | 12 H 1647 | 12 H 1647 | 实时确认>> |
348 | F772.06, probe with plunger tip 06, TD 2.5 mm, CuBe, gold 测试探针 | 12 H 1516 | 12 H 1516 | 实时确认>> |
349 | Threaded spring force contact with probe tip F3, D 1.0 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-F3-1,5 N-Rh-1,0 测试探针 | 11 H 4487 | 11 H 4487 | 实时确认>> |
350 | ICT spring force contact with probe tip C, D 1.3 mm, steel, 2.54 mm grid, 2.25 N, 2021-C-2,25 N-Au-1,3 测试探针 | 12 H 2111 | 12 H 2111 | 实时确认>> |
351 | F767.21, probe with plunger tip 21, TD 0.6 mm, steel, long-life gold 测试探针 | 11 H 5575 | 11 H 5575 | 实时确认>> |
352 | Receptacle for test probes series 1021/GV with forced guide H 1021/GVR 测试探头附件 | 11 H 4509 | 11 H 4509 | 实时确认>> |
353 | Protective sleeve for temperature probe, 512.950 温度和湿度控制器附件 | 08 N 1136 | 08 N 1136 | 实时确认>> |
354 | F731.11, probe with plunger tip 11, TD 0.65 mm, CuBe, gold 测试探针 | 11 H 4712 | 11 H 4712 | 实时确认>> |
355 | F886.17SM, switching probe, plunger tip 17, TD 3.5 mm, uncoated plastic 测试探针 | 12 H 5060 | 12 H 5060 | 实时确认>> |
356 | Pipe surface probe, RFP-100, 110 ohm, with platinum thin-film sensor 温度传感器和湿度传感器 | 06 N 8481 | 06 N 8481 | 实时确认>> |
357 | Threaded spring force contact with probe tip A, D 2.0 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-A-1,5 N-Au-2,0 测试探针 | 11 H 4425 | 11 H 4425 | 实时确认>> |
358 | ICT spring force contact with probe tip H, D 0.64 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-H-1,5 N-Au-0,64C 测试探针 | 12 H 2430 | 12 H 2430 | 实时确认>> |
359 | F732.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold 测试探针 | 12 H 1602 | 12 H 1602 | 实时确认>> |
360 | F785.06L, probe with plunger tip 06, TD 2.5 mm, CuBe, gold 测试探针 | 11 H 5804 | 11 H 5804 | 实时确认>> |
361 | Safety test probe, black, PRUEF 1610 FT Au, 975018-700 测试探针 | 35 F 126 | 35 F 126 | 实时确认>> |
362 | Threaded spring force contact with probe tip B, D 1.8 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-B-1,5 N-Rh-1,8 测试探针 | 11 H 4467 | 11 H 4467 | 实时确认>> |
363 | Switching probe, plunger tip 16, F885.16SM, 900 cN, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4827 | 11 H 4827 | 实时确认>> |
364 | Gateway and transmitter with cable probe, Starter-Set 2 温度和湿度控制器 | 06 N 8001 | 06 N 8001 | 实时确认>> |
365 | Threaded spring force contact with probe tip BS, D 0.38 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-BS-1,5 N-Au-0,38 测试探针 | 11 H 4402 | 11 H 4402 | 实时确认>> |
366 | F875.16L, switching probe, plunger tip 16, TD 1.0 mm, CuBe, gold 测试探针 | 12 H 1685 | 12 H 1685 | 实时确认>> |
367 | F703.18B078G150, probe with plunger tip 18, TD 0.78 mm, CuBe, gold 测试探针 | 11 H 5657 | 11 H 5657 | 实时确认>> |
368 | High-current spring force contact with probe tip DX, D 2.3 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 1060/G-DX-3,0 N-Au-2,3C 测试探针 | 12 H 2324 | 12 H 2324 | 实时确认>> |
369 | Battery charging and interface contact with probe tip C, D 3.5 mm, CuBe, 4.0 mm grid, 1.2 N, 5110/S.02-C-1,2 N-Au-3,5C 测试探针 | 12 H 2362 | 12 H 2362 | 实时确认>> |
370 | Threaded spring force contact with probe tip D3, D 1.4 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-D3-1,5 N-Au-1,4 测试探针 | 11 H 4481 | 11 H 4481 | 实时确认>> |
371 | F786.07, probe with plunger tip 07, TD 2.0 mm, steel, long-life gold 测试探针 | 12 H 1542 | 12 H 1542 | 实时确认>> |
372 | Switching probe, plunger tip 06, F885.06LM, 900 cN, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 4824 | 11 H 4824 | 实时确认>> |
373 | Pneumatic spring force contact with probe tip C, D 2.5 mm, steel, 4.0 mm grid, 0.6 N, 4004/G-C-0,6 N-Rh-2,5 测试探针 | 12 H 2548 | 12 H 2548 | 实时确认>> |
374 | Switching probe, plunger tip 06, F885.06LM, 350 cN, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4811 | 11 H 4811 | 实时确认>> |
375 | F788.06, probe with plunger tip 06, TD 0.9 mm, CuBe, gold 测试探针 | 11 H 5620 | 11 H 5620 | 实时确认>> |
376 | F875.06, switching probe, plunger tip 06, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4753 | 11 H 4753 | 实时确认>> |
377 | High-current spring force contact with probe tip FX, D 6.0 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 1060/G-FX-3,0 N-Au-6,0C 测试探针 | 12 H 2332 | 12 H 2332 | 实时确认>> |
378 | F733.17, probe with plunger tip 17, TD 2.3 mm, CuBe, gold 测试探针 | 12 H 1657 | 12 H 1657 | 实时确认>> |
379 | Probe F340.05, with plunger tip 05, TD 3.5 mm, steel, nickel 测试探针 | 11 H 5972 | 11 H 5972 | 实时确认>> |
380 | ICT spring force contact with probe tip G, D 2.0 mm, steel, 2.54 mm grid, 2.25 N, 2021-G-2,25 N-Au-2,0 测试探针 | 12 H 2115 | 12 H 2115 | 实时确认>> |
381 | Threaded spring force contact with probe tip F, D 1.8 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-F-1,5 N-Rh-1,8 测试探针 | 11 H 4416 | 11 H 4416 | 实时确认>> |
382 | F562.15, probe with plunger tip 15, TD 1.9 mm, CuBe, gold 测试探针 | 11 H 4643 | 11 H 4643 | 实时确认>> |
383 | F585.33S105L200, probe with plunger tip 33, TD 1.05 mm, steel, long-life gold 测试探针 | 11 H 5704 | 11 H 5704 | 实时确认>> |
384 | Air probe for Testo 635-2, 0602 1793 温度计和湿度计 | 21 K 793 | 21 K 793 | 实时确认>> |
385 | High-current spring force probe with tip CX, D 2.0 mm, gold-plated CuBe, 2.54 mm grid, 3.0 N, 1021/G-CX-3,0 N-Au-2,0 测试探针 | 12 H 2240 | 12 H 2240 | 实时确认>> |
386 | F875.06L, switching probe, plunger tip 06, TD 1.8 mm, CuBe, gold 测试探针 | 12 H 1675 | 12 H 1675 | 实时确认>> |
387 | H772LA/0.1, receptacle for probes F772/F786/F797, solder connection 测试探头附件 | 12 H 1527 | 12 H 1527 | 实时确认>> |
388 | TP 175 E, probe tips kit, 2 and 4 mm 测试探针 | 21 K 3560 | 21 K 3560 | 实时确认>> |
389 | F773.18, probe with plunger tip 18, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 5778 | 11 H 5778 | 实时确认>> |
390 | F109.18, probe with plunger tip 18 测试探针 | 11 H 5542 | 11 H 5542 | 实时确认>> |
391 | F733.12, probe with plunger tip 12, TD 2.3 mm, CuBe, gold 测试探针 | 12 H 1649 | 12 H 1649 | 实时确认>> |
392 | Threaded spring force contact with probe tip K, D 3.0 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-K-1,5 N-Ni-3,0 测试探针 | 11 H 4497 | 11 H 4497 | 实时确认>> |
393 | F588.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5744 | 11 H 5744 | 实时确认>> |
394 | Threaded spring force contact with probe tip D3, D 0.8 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-D3-1,5 N-Rh-0,8 测试探针 | 11 H 4480 | 11 H 4480 | 实时确认>> |
395 | Test lead with test probe, SMK425-L, 2.5 mm², red | 86 F 6922 | 86 F 6922 | 实时确认>> |
396 | H310, receptacle for probe F310 测试探头附件 | 11 H 5940 | 11 H 5940 | 实时确认>> |
397 | F735.06, probe with plunger tip 06, TD 4.0 mm, CuBe, gold 测试探针 | 11 H 5982 | 11 H 5982 | 实时确认>> |
398 | F773.05, probe with plunger tip 05, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 5760 | 11 H 5760 | 实时确认>> |
399 | Twist-proof spring force contact with probe tip Y5, A 4.0, B 0.65 mm, gold-plated CuBe, 4.0 mm grid, 1.5 N, 1053/G-Y5-1,5 N-Au-4,0x0,65C 测试探针 | 11 H 4524 | 11 H 4524 | 实时确认>> |
400 | Stub probe IP54 for testo Saveris 2 数据记录器附件 | 21 K 7682 | 21 K 7682 | 实时确认>> |
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