链到 238 个品牌: 更多品牌>>
Logo | 品牌 | 原产地 | 产品类别 | 更多 |
---|---|---|---|---|
![]() |
TESTEC | 德国 | 探头、探针 | TESTEC供应商 |
![]() |
Technisonic | 美国 | 探头、 超声探头 | Technisonic供应商 |
链到 43697 个记录:
记录 | 名称, 品牌, 型号 | 实时确认 | ||
---|---|---|---|---|
1001 | Switching probe, plunger tip 06, F885.06LM, 350 cN, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 4815 | 11 H 4815 | 实时确认>> |
1002 | F730.17, probe with plunger tip 17, TD 0.64 mm, CuBe, gold 测试探针 | 11 H 4681 | 11 H 4681 | 实时确认>> |
1003 | F075.06B120G150, probe with plunger tip 06, TD 1.2 mm, CuBe, gold 测试探针 | 11 H 5642 | 11 H 5642 | 实时确认>> |
1004 | F588.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5732 | 11 H 5732 | 实时确认>> |
1005 | ICT spring force contact with probe tip C, D 1.5 mm, CuBe, 2.54 mm grid, 2.25 N, 1025/E-C-2,25 N-Au-1,5C 测试探针 | 12 H 2134 | 12 H 2134 | 实时确认>> |
1006 | F875.16L, switching probe, plunger tip 16, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4770 | 11 H 4770 | 实时确认>> |
1007 | F732.06, probe with plunger tip 06, TD 2.5 mm, CuBe, gold 测试探针 | 11 H 4726 | 11 H 4726 | 实时确认>> |
1008 | F238.01, test probe with tip 01 测试探针 | 11 H 5500 | 11 H 5500 | 实时确认>> |
1009 | Battery charging and interface contact with probe tip D, D 2.3 mm, CuBe, 4.0 mm grid, 1.2 N, 5110/S.02-D-1.2 N-Au-2,3C 测试探针 | 12 H 2364 | 12 H 2364 | 实时确认>> |
1010 | High-current spring force contact with probe tip CX, D 4.0 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 1060/G-CX-3,0 N-Au-4,0C 测试探针 | 12 H 2322 | 12 H 2322 | 实时确认>> |
1011 | F732.18, probe with plunger tip 18, TD 1.3 mm, CuBe, gold 测试探针 | 12 H 1626 | 12 H 1626 | 实时确认>> |
1012 | Threaded receptacle for probes series 1021/G, solder connection, vacuum, H 1021/GRV-L 测试探头附件 | 12 H 2250 | 12 H 2250 | 实时确认>> |
1013 | ICT spring force contact with probe tip D, D 0.64 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-D-1,5 N-Au-0,64C 测试探针 | 12 H 2426 | 12 H 2426 | 实时确认>> |
1014 | F773.12, probe with plunger tip 12, TD 2.3 mm, CuBe, gold 测试探针 | 11 H 5771 | 11 H 5771 | 实时确认>> |
1015 | H730LA, receptacle for probe F730 测试探头附件 | 11 H 4683 | 11 H 4683 | 实时确认>> |
1016 | F732.05, probe with plunger tip 05, TD 2.0 mm, CuBe, gold 测试探针 | 11 H 4721 | 11 H 4721 | 实时确认>> |
1017 | Probe F340.14, with plunger tip 14, TD 3.5 mm, steel, nickel 测试探针 | 11 H 5978 | 11 H 5978 | 实时确认>> |
1018 | F886.17SM, switching probe, plunger tip 17, TD 4.5 mm, uncoated Host. 测试探针 | 12 H 5053 | 12 H 5053 | 实时确认>> |
1019 | ICT spring force contact with probe tip Q, D 1.3 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-Q-1,5 N-Au-1,3 测试探针 | 12 H 2468 | 12 H 2468 | 实时确认>> |
1020 | F875.11, switching probe, plunger tip 11, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4766 | 11 H 4766 | 实时确认>> |
1021 | F875.17, switching probe, plunger tip 17, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4760 | 11 H 4760 | 实时确认>> |
1022 | Surface probe, type K, 80PK-3A 温度计和湿度计配件 | 21 K 425 | 21 K 425 | 实时确认>> |
1023 | F772.17, probe with plunger tip 17, TD 2.0 mm, CuBe, gold 测试探针 | 11 H 4636 | 11 H 4636 | 实时确认>> |
1024 | H887RD, receptacle for probe F887, collar height 0.2 mm 测试探头附件 | 12 H 1782 | 12 H 1782 | 实时确认>> |
1025 | Safety test lead, 4.0 mm, with test probe, SPL 7316 Ni/1/100/SW, black | 86 F 6960 | 86 F 6960 | 实时确认>> |
1026 | ICT spring force contact with probe tip V, D 0.9 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-V-1,5 N-Au-0,9 测试探针 | 12 H 2472 | 12 H 2472 | 实时确认>> |
1027 | F772.11, probe with plunger tip 11, TD 0.7 mm, CuBe, gold 测试探针 | 11 H 4635 | 11 H 4635 | 实时确认>> |
1028 | F100.12B150G200, probe with plunger tip 12, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5678 | 11 H 5678 | 实时确认>> |
1029 | Safety test lead, 4.0 mm, with test probe, SPL 7315 Ni/1/100/RT, red | 86 F 6966 | 86 F 6966 | 实时确认>> |
1030 | F773.16, probe with plunger tip 16, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 5775 | 11 H 5775 | 实时确认>> |
1031 | Receptacle for probes series 1012/E, 1012/D and 1013/Z, with wire-wrap connection 10 mm, H 1012 W 测试探头附件 | 12 H 2058 | 12 H 2058 | 实时确认>> |
1032 | F732.06, probe with plunger tip 06, TD 1.3 mm, CuBe, gold 测试探针 | 11 H 4722 | 11 H 4722 | 实时确认>> |
1033 | F111.14, probe with plunger tip 14, TD 0.9 mm, steel, nickel 测试探针 | 11 H 5562 | 11 H 5562 | 实时确认>> |
1034 | High-current spring force probe with tip HX, D 1.8 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 160-HX-3,0 N-Au-1,8C 测试探针 | 12 H 2314 | 12 H 2314 | 实时确认>> |
1035 | PMS 4 LMLH, cable rack set 测试探头附件 | 86 F 4530 | 86 F 4530 | 实时确认>> |
1036 | F100.20B150G200, probe with plunger tip 20, TD 1.5 mm, CuBe, gold 测试探针 | 11 H 5699 | 11 H 5699 | 实时确认>> |
1037 | F733.06, probe with plunger tip 06, TD 4.0 mm, CuBe, gold 测试探针 | 12 H 1644 | 12 H 1644 | 实时确认>> |
1038 | ICT spring force contact with probe tip V, D 0.9 mm, steel, 2.54 mm grid, 1.5 N, 1034/E-V-1,5 N-Au-0,9 测试探针 | 12 H 2174 | 12 H 2174 | 实时确认>> |
1039 | F773.06, probe with plunger tip 06, TD 3.0 mm, CuBe, gold 测试探针 | 11 H 4661 | 11 H 4661 | 实时确认>> |
1040 | Threaded spring force contact with probe tip D, D 2.0 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-D-1,5 N-Au-2,0 测试探针 | 11 H 4445 | 11 H 4445 | 实时确认>> |
1041 | ICT spring force contact with probe tip Q, D 1.3 mm, steel, 2.54 mm grid, 2.25 N, 1025/E-Q-2,25 N-Au-1,3 测试探针 | 12 H 2142 | 12 H 2142 | 实时确认>> |
1042 | F788.33, probe with plunger tip 33, TD 0.6 mm, steel, long-life gold 测试探针 | 11 H 5629 | 11 H 5629 | 实时确认>> |
1043 | ICT spring force contact with probe tip B, D 0.64 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-B-1,5 N-Au-0,64C 测试探针 | 12 H 2420 | 12 H 2420 | 实时确认>> |
1044 | Test lead with test probe, PL 2600 S, black | 86 F 6950 | 86 F 6950 | 实时确认>> |
1045 | Receptacle for test probes series 3011/2GS and 3012/2GS, threaded, H 3011/GWR5 测试探头附件 | 11 H 4580 | 11 H 4580 | 实时确认>> |
1046 | F585.18S105L200, probe with plunger tip 18, TD 1.05 mm, steel, long-life gold 测试探针 | 11 H 5697 | 11 H 5697 | 实时确认>> |
1047 | Safety test probe set, replaceable inserts, 6-piece, SET SPS 2040/RT, red 测试探针 | 35 F 1202 | 35 F 1202 | 实时确认>> |
1048 | H722LA, receptacle for probes F722, solder connection 测试探头附件 | 11 H 4743 | 11 H 4743 | 实时确认>> |
1049 | Receptacle with cable (700 mm), S0006MC.VCRW 测试探头附件 | 12 H 1340 | 12 H 1340 | 实时确认>> |
1050 | F875.17, switching probe, plunger tip 17, TD 1.8 mm, CuBe, gold 测试探针 | 11 H 4751 | 11 H 4751 | 实时确认>> |
1051 | Probe with plunger tip 11, TD 1.3 mm, CuBe, gold, solder-proof, F706.11B130G150ST 测试探针 | 11 H 5876 | 11 H 5876 | 实时确认>> |
1052 | ICT spring force contact with probe tip B, D 0.64 mm, steel, 1.91 mm grid, 1.5 N, 1012/E-B-1,5 N-Au-0,64 测试探针 | 12 H 2010 | 12 H 2010 | 实时确认>> |
1053 | F732.17, probe with plunger tip 17, TD 1.5 mm, CuBe, gold 测试探针 | 12 H 1625 | 12 H 1625 | 实时确认>> |
1054 | High-current spring force probe with tip FX, D 2.3 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 160-CX-3,0 N-Au-3,0C 测试探针 | 12 H 2308 | 12 H 2308 | 实时确认>> |
1055 | F732.11, probe with plunger tip 11, TD 0.8 mm, CuBe, gold 测试探针 | 12 H 1614 | 12 H 1614 | 实时确认>> |
1056 | High-current spring force probe with tip CX, D 4.0 mm, gold-plated CuBe, 5.0 mm grid, 3.0 N, 1075-CX-3,0 N-Au-4,0C 测试探针 | 12 H 2264 | 12 H 2264 | 实时确认>> |
1057 | Receptacle for probes series 4005, H 4005 测试探头附件 | 12 H 2534 | 12 H 2534 | 实时确认>> |
1058 | Switching probe, plunger tip 06, F885.06LM, 200 cN, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4801 | 11 H 4801 | 实时确认>> |
1059 | Threaded spring force contact with probe tip D, D 1.25 mm, steel, 2.54 mm grid, 1.5 N, 1015/G-D-1,5 N-Au-1.25 测试探针 | 11 H 4412 | 11 H 4412 | 实时确认>> |
1060 | H885, receptacle, H 10.2 to 15.7 mm, HL 16.7 to 22.2 mm 测试探头附件 | 12 H 1722 | 12 H 1722 | 实时确认>> |
1061 | F875.16, switching probe, plunger tip 16, TD 1.0 mm, CuBe, gold 测试探针 | 11 H 4769 | 11 H 4769 | 实时确认>> |
1062 | Short receptacle, THL, for TK53B and TK54B 测试探头附件 | 12 H 1379 | 12 H 1379 | 实时确认>> |
1063 | Receptacle for test probes series 5207/G, H 5207/G 测试探头附件 | 12 H 2398 | 12 H 2398 | 实时确认>> |
1064 | Threaded receptacle for probes series 1021/G, solder connection, H 1021/GR-L 测试探头附件 | 12 H 2248 | 12 H 2248 | 实时确认>> |
1065 | Receptacle for series 1007 probes with crimp connection, H 1007 C 测试探头附件 | 12 H 1811 | 12 H 1811 | 实时确认>> |
1066 | F773.06C, probe with plunger tip 06, TD 4.0 mm, CuBe, gold 测试探针 | 11 H 5781 | 11 H 5781 | 实时确认>> |
1067 | ICT spring force contact with probe tip Q, D 0.5 mm, steel, 2.54 mm grid, 1.5 N, 1025/E-Q-1,5 N-Au-0,5 测试探针 | 12 H 2464 | 12 H 2464 | 实时确认>> |
1068 | Plug-in receptacle for probe series 1040, H 1040 测试探头附件 | 12 H 2098 | 12 H 2098 | 实时确认>> |
1069 | Threaded spring force contact with probe tip A, D 4.0 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-A-1,5 N-Au-4,0 测试探针 | 11 H 4466 | 11 H 4466 | 实时确认>> |
1070 | H563LA, receptacle for probe F563, solder connection 测试探头附件 | 12 H 1568 | 12 H 1568 | 实时确认>> |
1071 | High-current spring force contact with probe tip FX, D 4.0 mm, gold-plated CuBe, 4.0 mm grid, 3.0 N, 1060/G-FX-3,0 N-Au-4,0C 测试探针 | 12 H 2330 | 12 H 2330 | 实时确认>> |
1072 | ICT spring force contact with probe tip BST1, D 0.64 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-BST1-1,5 N-Au-0,64C 测试探针 | 12 H 2422 | 12 H 2422 | 实时确认>> |
1073 | Pneumatic spring force contact with probe tip A, D 3.0 mm, steel, 4.0 mm grid, 1.5 N, 4004-A-1,5 N-Rh-3,0 测试探针 | 12 H 2520 | 12 H 2520 | 实时确认>> |
1074 | High-current spring force probe with tip CX, D 2.0 mm, gold-plated CuBe, 2.54 mm grid, 3.0 N, 1021-CX-3,0 N-Au-2,0C 测试探针 | 12 H 2230 | 12 H 2230 | 实时确认>> |
1075 | F875.16, switching probe, plunger tip 16, TD 0.64 mm, CuBe, gold 测试探针 | 11 H 4767 | 11 H 4767 | 实时确认>> |
1076 | F100.21S090L300, probe with plunger tip 21, TD 0.9 mm, steel, long-life gold 测试探针 | 11 H 4622 | 11 H 4622 | 实时确认>> |
1077 | Receptacle for probe series 1007, with solder connection, H 1007 L 测试探头附件 | 12 H 1808 | 12 H 1808 | 实时确认>> |
1078 | F786.34, probe with plunger tip 34, TD 0.8 mm, steel, long-life gold 测试探针 | 12 H 1552 | 12 H 1552 | 实时确认>> |
1079 | Receptacle for probes series 1012/E, 1012/D and 1013/Z, with crimp connection, H 1012 C 测试探头附件 | 12 H 2218 | 12 H 2218 | 实时确认>> |
1080 | Receptacle for probe series 1075, with solder connection, H 1075 L 测试探头附件 | 12 H 2268 | 12 H 2268 | 实时确认>> |
1081 | Threaded spring force contact with probe tip F3, D 1.4 mm, steel, 4.0 mm grid, 1.5 N, 1060/G-F3-1,5 N-Au-1,4 测试探针 | 11 H 4488 | 11 H 4488 | 实时确认>> |
1082 | FWZ733T, probe insertion tools, for screwing, with torque limiting 测试探头附件 | 12 H 1666 | 12 H 1666 | 实时确认>> |
1083 | Test lead with test probe, PLF 400, PVC, black | 86 F 720 | 86 F 720 | 实时确认>> |
1084 | Probe F340.04, with plunger tip 04, TD 3.5 mm, steel, nickel 测试探针 | 11 H 5970 | 11 H 5970 | 实时确认>> |
1085 | F100.10S060L200, probe with plunger tip 10, TD 0.63 mm, steel, long-life gold 测试探针 | 11 H 5710 | 11 H 5710 | 实时确认>> |
1086 | ICT spring force contact with probe tip H, 1.5 mm, steel, 2.54 mm grid, 2.25 N, 1025/E-H-2,25 N-Au-1,5 测试探针 | 12 H 2140 | 12 H 2140 | 实时确认>> |
1087 | Threaded spring force contact with probe tip C, D 3.0 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-C-1,5 N-Rh-3.0 测试探针 | 11 H 4436 | 11 H 4436 | 实时确认>> |
1088 | F788.18, probe with plunger tip 18, TD 0.6 mm, CuBe, gold 测试探针 | 11 H 5626 | 11 H 5626 | 实时确认>> |
1089 | Safety test lead, 4.0 mm, with test probe, SPL 7316 Ni/1/100/RT, red | 86 F 6962 | 86 F 6962 | 实时确认>> |
1090 | Battery charging and interface contact with probe tip E1D, D 4.0 mm, steel, 6.5 mm grid, 3.0 N, 5082-E1D-3,0 N-Au-4,0 测试探针 | 12 H 2393 | 12 H 2393 | 实时确认>> |
1091 | ICT spring force contact with probe tip C, D 2.0 mm, steel, 2.54 mm grid, 2.25 N, 2021-C-2,25 N-Au-2,0 测试探针 | 12 H 2112 | 12 H 2112 | 实时确认>> |
1092 | Battery charging and interface contact with probe tip E, D 2.3 mm, CuBe, 4.0 mm grid, 1.5 N, 5110/S-E-1,5 N-Au-2,3C 测试探针 | 12 H 2356 | 12 H 2356 | 实时确认>> |
1093 | Threaded spring force contact with probe tip F1, D 0.65 mm, steel, 2.54 mm grid, 1.5 N, 1021/G-F-1,5 N-Ni-0.65 测试探针 | 11 H 4452 | 11 H 4452 | 实时确认>> |
1094 | Test lead with test probe, PLF 400, PVC, red | 86 F 722 | 86 F 722 | 实时确认>> |
1095 | ICT spring force contact with probe tip G, D 1.15 mm, CuBe, 1.91 mm grid, 1.5 N, 1012/E-G-1,5 N-Au-1.15C 测试探针 | 12 H 2428 | 12 H 2428 | 实时确认>> |
1096 | F875.16, switching probe, plunger tip 16, TD 0.7 mm, CuBe, gold 测试探针 | 12 H 1682 | 12 H 1682 | 实时确认>> |
1097 | Receptacle for test probe series 2021, with wire-wrap connection, H 2021 W 测试探头附件 | 12 H 2070 | 12 H 2070 | 实时确认>> |
1098 | Temperature probe, 0560 1113 温度计和湿度计 | 22 K 1379 | 22 K 1379 | 实时确认>> |
1099 | F585.33S105L100, probe with plunger tip 33, TD 1.05 mm, steel, long-life gold 测试探针 | 11 H 4656 | 11 H 4656 | 实时确认>> |
1100 | F588.33, probe with plunger tip 33, TD 0.9 mm, steel, long-life gold 测试探针 | 11 H 5746 | 11 H 5746 | 实时确认>> |
* 所有产品信息均源于第三方公开数据或用户上传,工业链仅整合供参考,真实价格货期请联系供应商确认.